Inventors:
James E. Davis - Boise ID, US
Michael D. Chaine - Boise ID, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
H02H 9/04
Abstract:
Apparatuses, circuits, and methods are disclosed for biased protection circuits for dual-direction nodes. In one such example apparatus, a protection circuit is coupled to a dual-direction node, and includes a positive protection component and a negative protection component. The protection circuit is configured to protect the dual-direction node during an over-limit electrical condition. The protection circuit is configured to control a turn-on condition of the protection circuit.