Inventors:
Dmitry Lubomirsky - Cupertino CA, US
Arulkumar Shanmugasundram - Sunnyvale CA, US
Allen D'Ambra - Burlingame CA, US
Timothy Weidman - Sunnyvale CA, US
Michael Stewart - Mountain View CA, US
Eugene Rabinovich - Fremont CA, US
Svetlana Sherman - San Jose CA, US
Manoocher Birang - Los Gatos CA, US
Yaxin Wang - Fremont CA, US
Michael Yang - Palo Alto CA, US
Bradley Hansen - San Carlos CA, US
International Classification:
H01L 21/44
Abstract:
Embodiments of the invention provide methods for depositing a material onto a surface of a substrate by using one or more electroless, electrochemical plating, CVD and/or ALD processes. Embodiments of the invention provide a method for depositing a seed layer on a substrate with an electroless process and to subsequently fill interconnect features on the substrate with an ECP process on a single substrate processing platform. Other aspects provide a method for depositing a seed layer on a substrate, fill interconnect features on a substrate, or sequentially deposit both a seed layer and fill interconnect features on the substrate. One embodiment provides a method for forming a capping layer over substrate interconnects. Methods include the use of a vapor dryer for pre- and post-deposition cleaning of substrates as well as a brush box chamber for post-deposition cleaning.