JOHN JACOB OTTUSCH V
Pilots at Tapia Dr, Malibu, CA
License number
California A5081875
Issued Date
Aug 2012
Expiration Date
Aug 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
6161 Tapia Dr, Malibu, CA 90265
Personal information
See more information about JOHN JACOB OTTUSCH V at radaris.comName
Address
Phone
6161 Tapia Dr, Malibu, CA 90265
Professional information
Method And Apparatus For Modeling Three-Dimensional Electromagnetic Scattering From Arbitrarily Shaped Three-Dimensional Objects
US Patent:
6847925, Jan 25, 2005
Filed:
Jun 15, 2001
Appl. No.:
09/882817
Inventors:
John Jacob Ottusch - Malibu CA, US
Stephen M. Wandzura - Agora Hills CA, US
Harry F. Contopanagos - Santa Monica CA, US
John F. Visher - Maibu CA, US
Vladimir Rokhlin - Santa Monica CT, US
Stephen M. Wandzura - Agora Hills CA, US
Harry F. Contopanagos - Santa Monica CA, US
John F. Visher - Maibu CA, US
Vladimir Rokhlin - Santa Monica CT, US
Assignee:
HRL Laboratories, LLC - Malibu CA
International Classification:
G06F 1710
US Classification:
703 2, 703 13
Abstract:
A computer program product, an apparatus, and a method for modeling equivalent surface sources on a closed, arbitrarily shaped object that result from the imposition of an arbitrary time-harmonic incident field (e. g. , a radar wave) are provided. An object divided into by a plurality of patches and parameters for the incident field and the properties of the object are provided to the system. Next, the system produces a discretized representation of a well-conditioned boundary integral equation in the form of a well-conditioned matrix equation, modeling the interaction between the incident field and the object. The well-conditioned linear system is solved numerically to determine equivalent surface sources on the object. The equivalent sources may then be used to determine electromagnetic fields resulting therefrom. The invention provides improved computational efficiency as well as increased modeling accuracy by effectively reducing the numerical precision necessary.
Frequency Detector For Discriminating Multi-Longitudinal Mode Laser Operation
US Patent:
4982082, Jan 1, 1991
Filed:
Nov 21, 1989
Appl. No.:
7/440009
Inventors:
John J. Ottusch - Malibu CA
Assignee:
Hughes Aircraft Company - Los Angeles CA
International Classification:
H01J 4014
US Classification:
250214R
Abstract:
A photodetector produces an output signal in response to irradiation by an optical beam from a pulsed laser. A delay unit delays the output signal for a period corresponding to one-half of one cycle of a beat frequency generated by interaction of two frequency components in the optical beam corresponding to two predetermined longitudinal modes of operation of the laser. A differential mixer subtractively combines the output of the photodetector with the output of the delay unit, to produce an output signal having the main profile of the laser pulses suppressed, and the beat frequency component, if present, amplified. A resonant circuit and amplifier may be provided to further amplify the beat frequency component. The output of the amplifier is integrated to produce a DC signal having a magnitude which corresponds to the amplitude of the beat frequency component. The DC signal is compared with a threshold value to discriminate between single and multimode operation of the laser.
Method And System For Determining An Optimized Artificial Impedance Surface
US Patent:
7929147, Apr 19, 2011
Filed:
May 31, 2008
Appl. No.:
12/156445
Inventors:
Bryan H. Fong - Los Angeles CA, US
Joseph S. Colburn - Malibu CA, US
John Ottusch - Malibu CA, US
Daniel F. Sievenpiper - Los Angeles CA, US
John L. Visher - Malibu CA, US
Joseph S. Colburn - Malibu CA, US
John Ottusch - Malibu CA, US
Daniel F. Sievenpiper - Los Angeles CA, US
John L. Visher - Malibu CA, US
Assignee:
HRL Laboratories, LLC - Malibu CA
International Classification:
G01B 11/02, H01Q 15/02, H01Q 15/24
US Classification:
356496, 343909
Abstract:
A method and system for determining an optimized artificial impedance surface is disclosed. An artificial impedance pattern is calculated on an impedance surface using an optical holographic technique given an assumed surface wave profile and a desired far field radiation pattern. Then, an actual surface wave profile produced on the impedance surface from the artificial impedance pattern, and an actual far field radiation pattern produced by the actual surface wave profile are calculated. An optimized artificial impedance pattern is then calculated by iteratively re-calculating the artificial impedance pattern from the actual surface wave profile and the desired far field radiation pattern. An artificial impedance surface is determined by mapping the optimized artificial impedance pattern onto a representation of a physical surface.
Method For Designing Artificial Surface Impedance Structures Characterized By An Impedance Tensor With Complex Components
US Patent:
7911407, Mar 22, 2011
Filed:
Jun 12, 2008
Appl. No.:
12/138083
Inventors:
Bryan Ho Lim Fong - Los Angeles CA, US
Joseph S. Colburn - Malibu CA, US
Paul R. Herz - Santa Monica CA, US
John J. Ottusch - Malibu CA, US
Daniel F. Sievenpiper - Santa Monica CA, US
John L. Visher - Malibu CA, US
Joseph S. Colburn - Malibu CA, US
Paul R. Herz - Santa Monica CA, US
John J. Ottusch - Malibu CA, US
Daniel F. Sievenpiper - Santa Monica CA, US
John L. Visher - Malibu CA, US
Assignee:
HRL Laboratories, LLC - Malibu CA
International Classification:
H01Q 15/02, H01Q 1/38
US Classification:
343909, 343700 MS, 343754
Abstract:
A method for designing artificial impedance surfaces is disclosed. The method involves matching impedance component values required for a given far-field radiation pattern (determined, for example, by holographic means) with measured or simulated impedance component values for the units of a lattice of conductive structures used to create an artificial impedance surface, where the units of the lattice have varied geometry. For example, a unit could be a square conductive structure with a slice (removed or missing material) through it. The measured or simulated impedance components are determined by measuring wavevector values for test surfaces in three or more directions over any number of test surfaces, where each unit of a given test surface has the same geometric shape and proportions as all of the other units of that test surface, but each test surface has some form of variation in the unit geometry from the other test surfaces. These test measurements create a table of geometry vs. impedance components that are used to design the artificial impedance structure.
Artificial Impedance Structure
US Patent:
7830310, Nov 9, 2010
Filed:
Jul 1, 2005
Appl. No.:
11/173182
Inventors:
Daniel F. Sievenpiper - Santa Monica CA, US
Joseph S. Colburn - Malibu CA, US
Bryan Ho Lim Fong - Los Angeles CA, US
Matthew W. Ganz - Marina del Rey CA, US
Mark F. Gyure - Oak Park CA, US
Jonathan J. Lynch - Oxnard CA, US
John Ottusch - Malibu CA, US
John L. Visher - Malibu CA, US
Joseph S. Colburn - Malibu CA, US
Bryan Ho Lim Fong - Los Angeles CA, US
Matthew W. Ganz - Marina del Rey CA, US
Mark F. Gyure - Oak Park CA, US
Jonathan J. Lynch - Oxnard CA, US
John Ottusch - Malibu CA, US
John L. Visher - Malibu CA, US
Assignee:
HRL Laboratories, LLC - Malibu CA
International Classification:
H01Q 1/38
US Classification:
343700MS, 343909
Abstract:
An artificial impedance structure and a method for manufacturing same. The structure contains a dielectric layer having generally opposed first and second surfaces, a conductive layer disposed on the first surface, and a plurality of conductive structures disposed on the second surface to provide a preselected impedance profile along the second surface.
Artificial Impedance Structure
US Patent:
7218281, May 15, 2007
Filed:
Jul 1, 2005
Appl. No.:
11/173187
Inventors:
Daniel F. Sievenpiper - Santa Monica CA, US
Joseph S. Colburn - Malibu CA, US
Bryan Ho Lim Fong - Los Angeles CA, US
Matthew W. Ganz - Marina del Rey CA, US
Mark F. Gyure - Oak Park CA, US
Jonathan J. Lynch - Oxnard CA, US
John Ottusch - Malibu CA, US
John L. Visher - Malibu CA, US
Joseph S. Colburn - Malibu CA, US
Bryan Ho Lim Fong - Los Angeles CA, US
Matthew W. Ganz - Marina del Rey CA, US
Mark F. Gyure - Oak Park CA, US
Jonathan J. Lynch - Oxnard CA, US
John Ottusch - Malibu CA, US
John L. Visher - Malibu CA, US
Assignee:
HRL Laboratories, LLC - Malibu CA
International Classification:
H01Q 1/38
US Classification:
343700MS, 343909
Abstract:
A method for guiding waves over objects, a method for improving a performance of an antenna, and a method for improving a performance of a radar are disclosed. The methods disclosed teach how an impedance structure can be used to guide waves over objects.