John F Scott, III
Engineers at Meadowaire Dr, Fort Collins, CO
License number
Colorado 25498
Issued Date
Feb 3, 1988
Renew Date
Mar 1, 2008
Expiration Date
Feb 28, 2010
Type
Professional Engineer
Address
Address
1909 Meadowaire Dr, Fort Collins, CO 80525
Professional information
Facilities Services Professional
Location:
Fort Collins, Colorado Area
Industry:
Facilities Services
Work:
Loveland Good Samaritan
Nov 1998 - Nov 2008
-
Director of Plant Operations
management
Jan 1998 - Jan 2008
-
Director of Plant Operations
Vencor Intensive Care Hospital
Jan 1994 - Jan 1997
-
management
The Children's Hospital
Jan 1991 - Jan 1994
-
supervision
Education:
Southwest Wisconsin Vocational/Technical Training School
U.S. Army Medical Training Center
Wisconsin School of Electronics
certificate, Electronic Technician Wisconsin School of Electronics
U.S. Army Medical Training Center
Wisconsin School of Electronics
certificate, Electronic Technician Wisconsin School of Electronics
Method Of Estimating Logic Cell Delay Time
US Patent:
5274568, Dec 28, 1993
Filed:
Dec 5, 1990
Appl. No.:
7/623310
Inventors:
Richard D. Blinne - Fort Collins CO
Richard J. Holzer - Fort Collins CO
Timothy R. Ouellette - Greeley CO
Rhea R. Ozman - Fort Collins CO
Richard A. Laubhan - Fort Collins CO
John Scott - Fort Collins CO
Richard J. Holzer - Fort Collins CO
Timothy R. Ouellette - Greeley CO
Rhea R. Ozman - Fort Collins CO
Richard A. Laubhan - Fort Collins CO
John Scott - Fort Collins CO
Assignee:
NCR Corporation - Dayton OH
International Classification:
G06F 1560
US Classification:
364489
Abstract:
A method for approximating the delay time of an excitation through a logic cell using the summation of a base delay, which is a function of delay coefficients for the cell and the total output load capacitance of the cell, and a rise/fall time correction, which is determined from the output rise/fall time of the driving cell and the sensitivity of the analyzed cell to rise/fall time. Other corrections/compensating factors include a performance derating factor which accounts for the multiplicative effects of operating voltage, temperature and process.