JEFFREY EMIL BLACKWOOD
Pilots at Watts St, Portland, OR
License number
Oregon A4288106
Issued Date
Apr 2014
Expiration Date
Apr 2019
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
2732 N Watts St, Portland, OR 97217
Personal information
See more information about JEFFREY EMIL BLACKWOOD at radaris.comName
Address
Phone
47073 Kirkpatrick Rd, Pendleton, OR 97801
3203 SE 75Th Ave, Portland, OR 97206
3064 Pippin Cir, Medford, OR 97504
130 Omni Cir, Medford, OR 97501
47073 Kirkpatrick Rd, Pendleton, OR 97801
Professional information
Anisotropic Probing Contactor
US Patent:
2004003, Feb 19, 2004
Filed:
Aug 19, 2002
Appl. No.:
10/223412
Inventors:
Jeffrey Blackwood - Portland OR, US
Tracy Myers - Clackamas OR, US
Tracy Myers - Clackamas OR, US
International Classification:
G01R031/02
US Classification:
324/754000
Abstract:
A contactor for providing electrical connections between a device under test and a tester input board. The device under test has first electrical contacts with a first pitch and a first diameter that contact a first side of the contactor, and the tester input board has second electrical contacts with a second pitch and a second diameter that contact a second side of the contactor. The contactor has a sheet of an electrically insulating material with a first surface at the first side of the contactor and a second surface at the second side of the contactor. The first surface and the second surface of the electrically insulating material are substantially parallel one to another. Electrical connectors extend along a length from the first side of the contactor to the second side of the contactor. The electrical connectors are substantially parallel one to another along their lengths. The electrical connectors have a third diameter that is no greater than the first pitch and the second pitch, and also have a third pitch that is no greater than the first pitch and the second pitch.
Net Segment Analyzer For Chip Cad Layout
US Patent:
2004014, Jul 22, 2004
Filed:
Jan 22, 2003
Appl. No.:
10/349564
Inventors:
Joseph Cowan - West Linn OR, US
Jeffrey Blackwood - Portland OR, US
Tracy Myers - Clackamas OR, US
Jeffrey Blackwood - Portland OR, US
Tracy Myers - Clackamas OR, US
International Classification:
G06F017/50
US Classification:
716/011000, 716/012000
Abstract:
A method of displaying a net in a CAD layout for an integrated circuit chip includes steps for receiving a netlist of an integrated circuit design, displaying a CAD layout of the netlist, selecting a net segment in the CAD layout, and displaying a physical characteristics list of information items representative of physical characteristics of the net segment.
Whole-Wafer Photoemission Analysis
US Patent:
7245758, Jul 17, 2007
Filed:
Aug 20, 2003
Appl. No.:
10/644116
Inventors:
Jeffrey Blackwood - Portland OR, US
Tracy Myers - Clackamas OR, US
Tracy Myers - Clackamas OR, US
Assignee:
LSI Corporation - Milpitas CA
International Classification:
G06K 9/00
US Classification:
382145
Abstract:
A method and system for collecting and analyzing photoemission data wherein illumination and photoemission images are acquired for a plurality of die, such as for each die on a wafer. Then, the images are overlaid, aligned, and assembled in a mosaic, thereby allowing analysis of the photoemission occurring across a plurality of die, such as across the entire wafer. Preferably, gathering this data allows statistical analysis of the photoemission such as analysis of commonly emitting locations to identify structures/cells that are sensitive to the manufacturing process.
Wafer-Mounted Micro-Probing Platform
US Patent:
7023225, Apr 4, 2006
Filed:
Apr 16, 2003
Appl. No.:
10/417049
Inventors:
Jeffrey Blackwood - Portland OR, US
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
G01R 31/02, G01R 31/26
US Classification:
324754, 324758, 324765
Abstract:
A method and apparatus for probing semiconductor circuits using a wafer-mounted micro-probing platform. A platform or platen is affixed to the surface of a wafer. Probe manipulators are mounted on the platen, and probes extend from or are otherwise associated with the probe manipulators. The probe manipulators may be fixed in position, or they may be motorized to allow adjustment of the probe positions while in-situ. During probing, electrical signals are preferably sent to the probes viz. -a-viz. feedthrough interfaces. The platen which is affixed to the surface of the wafer effectively serves two purposes: 1) as a mounting point for the probe manipulators; and 2) to mechanically stiffen the wafer so that the wafer does not flex, thereby requiring re-positioning of the probes.