MR. JAMES NOVAK, RPH
Pharmacy at Indian School Rd, Albuquerque, NM

License number
New Mexico RP00005728
Category
Pharmacy
Type
Pharmacist
Address
Address
13000 Indian School Rd NE, Albuquerque, NM 87112
Phone
(505) 298-0413
(505) 298-1899

Professional information

See more information about JAMES NOVAK at trustoria.com
James Novak Photo 1
It Technologist

It Technologist

Location:
Rio Rancho, New Mexico
Industry:
Computer Hardware
Work:
Hewlett-Packard - Rio Rancho, New Mexico Jul 2010 - Jun 2013 - Technical Solutions Consultant Digital Traffic Systems - Albuquerque, NM May 2000 - Jun 2009 - Manager of Systems General Meters Corp - Colorado Springs, CO Oct 1998 - May 2000 - Firmware Engineer B Kaman Sciences Corp Aug 1993 - Oct 1998 - Associate Engineer Literal Corporation - Colorado Springs, CO Jun 1987 - Aug 1993 - Senior Technician Brown Disc Manuf - Colorado Springs, CO Feb 1984 - Feb 1987 - Maintenance Technician
Education:
Pikes Peak Community College 2003 - 2003
Colorado Technical College 1983 - 1984
Associate of Science BioMedical Engineering Technology, BioMedical Engineering Technology
Interests:
Amateur Radio, Outdoor adventure on an ATV, new technology, gadgets
Certifications:
MCTS 70-642 Configuring Windows Server 2008 Network Infrastructure, Microsoft
MCP NT 4.0, Microsoft


James Novak Photo 2
Sensor System For Web Inspection

Sensor System For Web Inspection

US Patent:
6369588, Apr 9, 2002
Filed:
Nov 9, 1999
Appl. No.:
09/437350
Inventors:
Gerard E. Sleefe - Cedar Crest NM 87008
Thomas J. Rudnick - St. Louis MO 63119
James L. Novak - Albuquerque NM 87111
International Classification:
G01B 704
US Classification:
324686, 324663, 324671
Abstract:
A system for electrically measuring variations over a flexible web has a capacitive sensor including spaced electrically conductive, transmit and receive electrodes mounted on a flexible substrate. The sensor is held against a flexible web with sufficient force to deflect the path of the web, which moves relative to the sensor.


James Novak Photo 3
Non-Contact Capacitance Based Image Sensing Method And System

Non-Contact Capacitance Based Image Sensing Method And System

US Patent:
5281921, Jan 25, 1994
Filed:
Apr 24, 1990
Appl. No.:
7/514051
Inventors:
James L. Novak - Albuquerque NM
James J. Wiczer - Albuquerque NM
International Classification:
G01R 2726
US Classification:
324671
Abstract:
A system and a method for imaging desired surfaces of a workpiece. A sensor having first and second sensing electrodes which are electrically isolated from the workpiece is positioned above and in proximity to the desired surfaces of the workpiece. An electric field is developed between the first and second sensing electrodes of the sensor in response to input signals being applied thereto and capacitance signals are developed which are indicative of any disturbances in the electric field as a result of the workpiece. An image signal of the workpiece may be developed by processing the capacitance signals. The image signals may provide necessary control information to a machining device for machining the desired surfaces of the workpiece in processes such as deburring or chamfering. Also, the method and system may be used to image dimensions of weld pools on a workpiece and surfaces of glass vials. The sensor may include first and second preview sensors used to determine the feed rate of a workpiece with respect to the machining device.


James Novak Photo 4
Feed Rate Measuring Method And System

Feed Rate Measuring Method And System

US Patent:
5473257, Dec 5, 1995
Filed:
Aug 26, 1994
Appl. No.:
8/296131
Inventors:
James L. Novak - Albuquerque NM
James J. Wiczer - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01P 366
US Classification:
324671
Abstract:
A system and method are provided for establishing the feed rate of a workpiece along a feed path with respect to a machine device. First and second sensors each having first and second sensing electrodes which are electrically isolated from the workpiece are positioned above, and in proximity to the desired surfaces of the workpiece along a feed path. An electric field is developed between the first and second sensing electrodes of each sensor and capacitance signals are developed which are indicative of the contour of the workpiece. First and second image signals representative of the contour of the workpiece along the feed path are developed by an image processor. The time delay between corresponding portions of the first and second image signals are then used to determine the feed rate based upon the separation of the first and second sensors and the amount of time between corresponding portions of the first and second image signals.


James Novak Photo 5
Spatial Feature Tracking Impedence Sensor Using Multiple Electric Fields

Spatial Feature Tracking Impedence Sensor Using Multiple Electric Fields

US Patent:
5793176, Aug 11, 1998
Filed:
Apr 2, 1993
Appl. No.:
8/042292
Inventors:
James L. Novak - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
H02P 700
US Classification:
318587
Abstract:
Linear and other features on a workpiece are tracked by measuring the fields generated between electrodes arrayed in pairs. One electrode in each pair operates as a transmitter and the other as a receiver, and both electrodes in a pair are arrayed on a carrier. By combining and subtracting fields between electrodes in one pair and between a transmitting electrode in one pair and a receiving electrode in another pair, information describing the location and orientation of the sensor relative to the workpiece in up to six degrees of freedom may be obtained. Typical applications will measure capacitance, but other impedance components may be measured as well. The sensor is designed to track a linear feature axis or a protrusion or pocket in a workpiece. Seams and ridges can be tracked by this non-contact sensor. The sensor output is useful for robotic applications.


James Novak Photo 6
Object Locating System

Object Locating System

US Patent:
5764066, Jun 9, 1998
Filed:
Jun 19, 1997
Appl. No.:
8/878693
Inventors:
James L. Novak - Albuquerque NM
Ben Petterson - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01R 2726
US Classification:
324662
Abstract:
A sensing system locates an object by sensing the object's effect on electric fields. The object's effect on the mutual capacitance of electrode pairs varies according to the distance between the object and the electrodes. A single electrode pair can sense the distance from the object to the electrodes. Multiple electrode pairs can more precisely locate the object in one or more dimensions.


James Novak Photo 7
Geophysics-Based Method Of Locating A Stationary Earth Object

Geophysics-Based Method Of Locating A Stationary Earth Object

US Patent:
7376507, May 20, 2008
Filed:
May 27, 2004
Appl. No.:
10/855145
Inventors:
Michael R. Daily - Albuquerque NM, US
Steven B. Rohde - Corrales NM, US
James L. Novak - Albuquerque NM, US
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01C 21/26, H04B 7/185
US Classification:
701207, 701213, 34235701, 34235706, 340988
Abstract:
A geophysics-based method for determining the position of a stationary earth object uses the periodic changes in the gravity vector of the earth caused by the sun- and moon-orbits. Because the local gravity field is highly irregular over a global scale, a model of local tidal accelerations can be compared to actual accelerometer measurements to determine the latitude and longitude of the stationary object.


James Novak Photo 8
Sensing Roller For In-Process Thickness Measurement

Sensing Roller For In-Process Thickness Measurement

US Patent:
5537048, Jul 16, 1996
Filed:
Mar 14, 1994
Appl. No.:
8/213438
Inventors:
James L. Novak - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01R 2726
US Classification:
324690
Abstract:
An apparatus and method for processing materials by sensing roller, in which the sensing roller has a plurality of conductive rings (electrodes) separated by rings of dielectric material. Sensing capacitances or impedances between the electrodes provides information on thicknesses of the materials being processed, location of wires therein, and other like characteristics of the materials.


James Novak Photo 9
Omni-Directional Crash Sensor

Omni-Directional Crash Sensor

US Patent:
7516645, Apr 14, 2009
Filed:
Jun 8, 2007
Appl. No.:
11/808382
Inventors:
Philip W. Kithil - Santa Fe NM, US
James L. Novak - Albuquerque NM, US
Daniel J. Du Rocher - Metamora MI, US
Assignee:
Methode Electronics, Inc. - Chicago IL
International Classification:
G01M 7/00
US Classification:
73 1209, 73777
Abstract:
A stress wave sensor comprising a piezoelectric film and means therein for connection to sensor electronics. The piezoelectric film preferably comprises polyvinylidene fluoride. Also a stress wave sensor system and methods employing one or more such stress wave sensors, preferably attached to a vehicle transparent component, most preferably to the vehicle windshield.


James Novak Photo 10
Impedance Sensing Of Flaws In Non-Homogenous Materials

Impedance Sensing Of Flaws In Non-Homogenous Materials

US Patent:
5602486, Feb 11, 1997
Filed:
Nov 10, 1994
Appl. No.:
8/336999
Inventors:
James L. Novak - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01N 2702, G01R 2702
US Classification:
324671
Abstract:
An apparatus and method for sensing impedances of materials placed in contact therewith. The invention comprises a plurality of drive electrodes and one or more sense electrodes. Both rotating electric fields and differently shaped electric fields are provided for, as are analysis of structure and composition at different orientations and depths.