JACOB A ABRAHAM
Pilots at Pt Blf Dr, Austin, TX
License number
Texas A0003106
Issued Date
Jun 2015
Expiration Date
Jun 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
2106 Point Bluff Dr, Austin, TX 78746
Professional information
Professor At University Of Texas
Position:
Professor at University of Texas at Austin
Location:
Austin, Texas Area
Industry:
Research
Work:
University of Texas at Austin
since 1988
-
Professor
University of Illinois at Urbana-Champaign
1975 - 1988
-
Professor
Education:
Stanford University
Doctor of Philosophy (Ph.D.), Electrical Engineering and Computer Science
Doctor of Philosophy (Ph.D.), Electrical Engineering and Computer Science
Honor & Awards:
Listing in Who's Who in America, 1986 - present
Fellow, IEEE
Fellow, ACM
IEEE Emanuel R. Piore Award, 2005
Many "Best Paper" awards at International Conferences
Control Flow Deviation Detection For Software Security
US Patent:
2009032, Dec 31, 2009
Filed:
Jun 15, 2009
Appl. No.:
12/484839
Inventors:
Jacob A. Abraham - Austin TX, US
Ramtilak Vemu - Austin TX, US
Ramtilak Vemu - Austin TX, US
International Classification:
G06F 11/00
US Classification:
726 22
Abstract:
Provided are methods and systems for control flow deviation detection. Provided are methods for software security, comprising executing a software program, generating a run-time signature variable, updating the run-time signature variable as the software program executes, comparing the run-time signature variable with a pre-computed signature, and detecting a deviation in control flow of the software program based on the comparison between the run-time signature variable and the pre-computed signature.
Method For Fabricating Three-Dimensional Microstructures And A High-Sensitivity Integrated Vibration Sensor Using Such Microstructures
US Patent:
4948757, Aug 14, 1990
Filed:
Feb 9, 1989
Appl. No.:
7/307930
Inventors:
Kailash C. Jain - Sterling Heights MI
Jacob A. Abraham - Austin TX
Jacob A. Abraham - Austin TX
Assignee:
General Motors Corporation - Detroit MI
International Classification:
H01L 21302, H01L 21311
US Classification:
437240
Abstract:
A method for preferentially etching phosphosilicate glass to form a micromechanical structure includes forming a layer of phosphosilicate glass on a substrate and opening at least one via in the phosphosilicate glass layer. A layer of material which is patterned to produce a micromechanical structure is formed over the phosphosilicate glass layer which extends through the via and adheres to the substrate. The phosphosilicate glass layer is then removed by immersing the device in an etchant bath containing an aqueous ammoniacal hydrogen peroxide solution. The resulting micromechanical structure has at least one point of attachment to the substrate and is otherwise spaced apart from the substrate by an air gap. A method for attaching an overhanging mass to a miniature cantilever beam using microelectronics fabrication technology is also provided in which the center of gravity is shifted to the endpoint of the free end of the beam. There is further provided an integrated sensor which includes at least one micromechanical transducing structure and on-board detection circuitry which detects extremely small motions of the structure and produces a corresponding digital output.
Microwave Oven With Antenna Array
US Patent:
2013017, Jul 11, 2013
Filed:
Jan 4, 2013
Appl. No.:
13/734398
Inventors:
Ranjit Gharpurey - Austin TX, US
Jacob A. Abraham - Austin TX, US
Jacob A. Abraham - Austin TX, US
International Classification:
H05B 6/72
US Classification:
219745
Abstract:
Techniques are disclosed relating to microwave ovens. In one embodiment, an apparatus is disclosed that includes a microwave heating unit. The microwave heating unit is configured to radiate microwaves into a cavity and includes an antenna array coupled to one or more amplifiers. The antenna array is configured to generate the radiated microwaves. In some embodiments, the microwave oven is configured to measure temperatures of a item within the cavity, and to steer a microwave beam produced by the antenna array based on the measured temperatures.
Method And Apparatus For Testing A System-On-A-Chip
US Patent:
6964004, Nov 8, 2005
Filed:
Oct 24, 2002
Appl. No.:
10/280543
Inventors:
Abhijit Chatterjee - Atlanta GA, US
Dave Majernik - Mt. Airy MD, US
Sasikumar Cherubal - Tucson AZ, US
Sudip Chakrabarti - San Jose CA, US
Ramakrishna Voorakaranam - Phoenix AZ, US
Jacob A. Abraham - Austin TX, US
Douglas Goodman - Tucson AZ, US
Dave Majernik - Mt. Airy MD, US
Sasikumar Cherubal - Tucson AZ, US
Sudip Chakrabarti - San Jose CA, US
Ramakrishna Voorakaranam - Phoenix AZ, US
Jacob A. Abraham - Austin TX, US
Douglas Goodman - Tucson AZ, US
Assignee:
Ardext Technologies, Inc. - Tucson AZ
International Classification:
G01R031/28
US Classification:
714732, 714733
Abstract:
A method for testing a system on a chip or a system on a package (““SOPC”) having a plurality of internal modules that are tested to determine whether predetermined performance specifications are satisfied. A first module of the SOPC is selected for testing. A determination is made as to whether the first module is directly accessible or not. If the first module is directly accessible, the module may be tested with automated test equipment external to the SOPC. If the first module is not directly accessible, the module may be tested with a second and third module of the SOPC.
Circuit Modeling Apparatus, Systems, And Methods
US Patent:
2005019, Sep 1, 2005
Filed:
Dec 20, 2004
Appl. No.:
11/017378
Inventors:
Jacob Abraham - Austin TX, US
Vivekananda Vedula - Austin TX, US
Vivekananda Vedula - Austin TX, US
International Classification:
G06F011/00, G06F017/50
US Classification:
714738000, 703002000
Abstract:
Apparatus and systems, as well as methods and articles, may perform operations including selecting a monitor associated with a property of a circuit module, augmenting the circuit module with the monitor to provide an augmented circuit, searching for a test for an output of the augmented circuit to find a sequence of states having a length up to n, establishing a witness to the property if the test is found, and if no test is found to exist within the sequence of states, determining the property to be invalid or false for a bound of n.
Performing Analog-To-Digital Conversion By Computing Delay Time Between Traveling Waves In Transmission Lines
US Patent:
2009029, Dec 3, 2009
Filed:
May 8, 2009
Appl. No.:
12/437669
Inventors:
Arjang Hassibi - Austin TX, US
Ehsan Afshari - Newfield NY, US
Chaoming Zhang - Austin TX, US
Jacob Abraham - Austin TX, US
Ehsan Afshari - Newfield NY, US
Chaoming Zhang - Austin TX, US
Jacob Abraham - Austin TX, US
Assignee:
Board of Regents, The University of Texas System - Austin TX
Cornell University - Ithaca NY
Cornell University - Ithaca NY
International Classification:
H03M 1/12
US Classification:
341155
Abstract:
A method and device for converting an analog input electrical signal to a digital signal. A plurality of integrated active and/or passive transmission lines may be implemented with signal-dependant propagation velocities. The delay differences of pulses traveling through these transmission lines are compared, and the collective results are used to evaluate and subsequently quantize the input signal.