CHARLES D LEE
Engineering in San Jose, CA

6624884, Sep 23, 2003

Apr 28, 1997

08/840351

Wayne Isami Imaino - San Jose CA
Anthony Juliana, Jr. - San Jose CA
Milton Russell Latta - San Jose CA
Charles H. Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal J. Rosen - Los Gatos CA
Steven Meeks - San Jose CA

International Business Machines Corporation - Armonk NY

G01N 2188

3562372

A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In an embodiment of the invention, light reflected from the surface at an angle slightly offset from perpendicular is routed through a telecentric lens to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects. An optional calibration system periodically reflects the scanning beam back to a detector to form a reference signal for use in absolute reflectivity measurements.

5867261, Feb 2, 1999

Apr 28, 1997

8/840352

Wayne Isami Imaino - San Jose CA
Anthony Juliana - San Jose CA
Milton Russell Latta - San Jose CA
Charles H. Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal J. Rosen - Los Gatos CA

International Business Machines Corporation - Armonk NY

G01N 2188

3562372

A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. The LIT uses a mechanical lifter which moves the disk through the laser scan lines (i. e. perpendicular to the scan lines) to allow the entire surface on each side of the disk to be scanned. The light reflected from the surface is routed to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. The edges of the planar surface in the pixel data are determined for each scan line while data acquisition is in progress. A mask is applied to direct the defect detection only to meaningful areas of the disk while data acquisition is in progress. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects.

5945685, Aug 31, 1999

Nov 19, 1997

8/974272

Wayne Isami Imaino - San Jose CA
Anthony Juliana - San Jose CA
Milton Russell Latta - San Jose CA
Charles Cheng-Hsing Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal Jervis Rosen - Los Gatos CA

International Business Machines Corporation - Armonk NY

G01N 2186

25055945

A glass disk substrate inspection tool uses a polarized laser beam that is directed to the first surface of the disk substrate at Brewster's angle and is then transmitted through the disk substrate to a light detector that generates a signal representative of the intensity of the light received. Because the light polarized parallel to the plane of incidence, i. e. , the plane formed by the line of the incident beam and a line perpendicular to the surface of the disk substrate, is completely transmitted, there is no surface reflection at either the first or second surfaces of the disk substrate. The polarized beam is directed by a first rotating scanner to the input of a telecentric lens assembly that provides an output beam parallel to its optical axis as the beam is being scanned. The beam is then directed by a first fixed mirror to strike the first surface of the disk substrate at Brewster's angle as the beam is scanned along a line across the first disk surface. The beam is then transmitted through the substrate to the second surface of the disk substrate to a second fixed mirror that redirects the beam to a second telecentric lens assembly.

6935925, Aug 30, 2005

Jun 30, 2004

10/881145

Parul Agrawal - Saratoga CA, US
Bradley Frederick Baumgartner - Los Banos CA, US
Norman Chu - San Francisco CA, US
Charles Lee - San Jose CA, US
Tony Mello - San Jose CA, US
Christopher Ramm - San Jose CA, US
Bob Clyde Robinson - Hollister CA, US

Hitachi Global Storage Technologies Netherlands B.V. - Amsterdam

B24B049/00

451 8, 451 63

An in-situ technique for the acoustic emission monitoring of burnish heads while they are cleaning or burnishing magnetic media is described. The burnishing process is monitored and controlled to identify interaction or contact between the head and media due to, for example, burnish head damage, substrate curvature problems, and lube pick-up problems. A piezoelectric sensor is mounted on the burnish arm that holds the burnish heads. When head-disk interaction occurs, stress waves travel through the head to the sensor and an amplified signal is gathered in a tester database as an acoustic emission. Abnormal conditions will trigger an unusual emission that is detected to trigger an alert.

7164557, Jan 16, 2007

Feb 23, 2004

10/784506

Parul Agrawal - Saratoga CA, US
Hang Fai Ngo - San Jose CA, US
Charles Lee - San Jose CA, US
Li-Chung Lee - Saratoga CA, US
Ullal Vasant Nayak - San Jose CA, US
Stephen Olson - Palo Alto CA, US
Robert N. Payne - San Jose CA, US
Christopher Ramm - San Jose CA, US

Hitachi Global Storage Technologies Netherlands BV - Amsterdam

G11B 5/60

3602362, 3602364, 3602365, 3602369, 360237

An air bearing burnish slider burnishes very small asperities and cleans the loose particles that adhere to the magnetic recording media. The slider applies a controllable contact force to effectively burnish disk asperities or partially attached particles. In addition, the slider cleans the loose particles effectively while flying in a stable fashion. In a low pitch design, diagonal rails push particles away from the disk surface and trailing edge pads contact the disk at lower linear velocities. Rail pads retain loose contamination and debris in their pockets and burnish asperities. Another design provides a milder burnish force and flies in a high pitch configuration. The trailing edge pads provide stable contacts and the rails help in sweeping away debris. In both designs, the contact forces can be controlled by adjusting linear velocities. A step taper at the leading edge provides a pitch-producing lift force.

5917589, Jun 29, 1999

Apr 28, 1997

8/840339

Wayne Isami Imaino - San Jose CA
Anthony Juliana - San Jose CA
Milton Russell Latta - San Jose CA
Charles H. Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal J. Rosen - Los Gatos CA

International Business Machines Corporation - Armonk NY

G01N 2188

3562372

A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. The LIT uses a mechanical lifter which moves the disk through the laser scan lines (i. e. perpendicular to the scan lines) to allow the entire surface on each side of the disk to be scanned. The light reflected from the surface is routed to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. The edges of the planar surface in the pixel data are determined for each scan line while data acquisition is in progress. A mask is applied to direct the defect detection only to meaningful areas of the disk while data acquisition is in progress. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects.

5847823, Dec 8, 1998

Apr 28, 1997

8/840355

Wayne Isami Imaino - San Jose CA
Anthony Juliana - San Jose CA
Milton Russell Latta - San Jose CA
Charles H. Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal J. Rosen - Los Gatos CA
James Hammond Brannon - Palo Alto CA

International Business Machines Corporation - Armonk NY

G02B 500, G01N 2188

356243

A calibration disk for a laser based inspection tool (LIT) for inspecting planar surfaces is described. The calibration disk has a plurality of overlapping bumps forming a circular ring with a width of one bump. The circular ring of bumps forms a feature of a known width and position on a disk which can be used to adjust one or more LIT's to yield calibrated results.

6100971, Aug 8, 2000

Apr 28, 1997

8/841037

Wayne Isami Imaino - San Jose CA
Anthony Juliana - San Jose CA
Milton Russell Latta - San Jose CA
Charles H. Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal J. Rosen - Los Gatos CA

International Business Machines Corporation - Armonk NY

G01N 2188

3562372

A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In an embodiment of the invention, the incident beam is directed onto the surface to be inspected at an angle slightly offset from perpendicular so that the reflected beam is physically separated from the incident beam. Although slightly offset the reflected beam is routed back through the telecentric lens and scanner which are used for the incident beam. Preferably an aperture mask is placed in the path of the reflected beam and the incident beam to limit the cone of scattered light. Since the incident and reflected beams are physically separated, there may be an aperture for each beam, but the two masks may be physically connected. The aperture masks may also be used for alignment adjustments of the beams.

5969370, Oct 19, 1999

Apr 28, 1997

8/840358

Wayne Isami Imaino - San Jose CA
Anthony Juliana - San Jose CA
Milton Russell Latta - San Jose CA
Charles H. Lee - San Jose CA
Wai Cheung Leung - San Jose CA
Hal J. Rosen - Los Gatos CA

International Business Machines Corporation - Armonk NY

G01N 2188

25055906

A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In one embodiment of the invention, a disk is moved into an inspection subcompartment between a pair of air knives which blow partially ionized air onto the planar sides of the disk to remove loose particles adhering thereto. After the disk moves through the air knife streams, the two laser beams scan the two sides of the disk. Preferably the scan occurs after the air knives have been turned off and as the disk moves out of the inspection subcompartment. The subcompartment may optionally have an air source which forces air to flow out of the subcompartment to aid in maintaining a clean environment for inspection.