ZAVEN ARZOUMANIAN
Pilots at Rdg Rd, Greenbelt, MD
License number
Maryland A3957148
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
59G Ridge Rd, Greenbelt, MD 20770
Professional information
Instrument And Method For X-Ray Diffraction, Fluorescence, And Crystal Texture Analysis Without Sample Preparation
US Patent:
2011000, Jan 13, 2011
Filed:
Aug 6, 2010
Appl. No.:
12/852317
Inventors:
KEITH GENDREAU - Greenbelt MD, US
Jose Vanderlei Martins - Greenbelt MD, US
Zaven Arzoumanian - Greenbelt MD, US
Jose Vanderlei Martins - Greenbelt MD, US
Zaven Arzoumanian - Greenbelt MD, US
Assignee:
UNIVERSITY OF MARYLAND, BALTIMORE COUNTY - Baltimore MD
International Classification:
G01N 23/223
US Classification:
378 46
Abstract:
An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
Instrument And Method For X-Ray Diffraction, Fluorescence, And Crystal Texture Analysis Without Sample Preparation
US Patent:
7796726, Sep 14, 2010
Filed:
Feb 14, 2007
Appl. No.:
11/706693
Inventors:
Keith Gendreau - Greenbelt MD, US
Jose Vanderlei Martins - Greenbelt MD, US
Zaven Arzoumanian - Greenbelt MD, US
Jose Vanderlei Martins - Greenbelt MD, US
Zaven Arzoumanian - Greenbelt MD, US
Assignee:
University of Maryland, Baltimore County - Baltimore MD
International Classification:
G01N 23/223, G01N 23/20
US Classification:
378 46, 378 44, 378 45, 378 49, 378 71, 378 76, 378 79, 378 80, 378 81, 378 82, 378 83
Abstract:
An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.