Inventors:
Zachary A. Miller - San Francisco CA, US
International Classification:
A61B 6/08
Abstract:
A system and method for determining the location of an x-ray source of an x-ray machine and adjusting grid lines in an anti-scatter grid are disclosed. An ideal beam path is obtained and is used to adjust grid lines in the anti-scatter grid. In one embodiment, the invention uses a source locator to locate the x-ray source, communicate this location to the said adjustable anti-scatter grid which could align the grid lines mechanically, by means of servos attached to the grid lines, to the ideal x-ray beam path. In other embodiment electrical currents are used to align grid lines with the beam source. By aligning the grid lines with the beam path, images with increased contrast and reduced noise can be produced.