XIN WANG
Acupuncture in Princeton, NJ
License number
New Jersey 25MZ00112400
Issued Date
Apr 5, 2015
Expiration Date
Jun 30, 2017
Category
Acupuncture
Type
Acupuncturist
Address
Address
Princeton, NJ
Personal information
See more information about XIN WANG at radaris.comName
Address
Phone
425 Mount Prospect Ave APT 1, Newark, NJ 07104
316 S Broad St #3, Trenton, NJ 08608
3 Schenck Rd, Princeton Junction, NJ 08550
Professional information
See more information about XIN WANG at trustoria.com
Background Subtraction-Mediated Data-Dependent Acquistion
Background Subtraction-Mediated Data-Dependent Acquistion
US Patent:
2013029, Nov 7, 2013
Filed:
Jan 18, 2012
Appl. No.:
13/822922
Inventors:
Xin Wang - Princeton NJ, US
International Classification:
H01J 49/00
US Classification:
702 23
Abstract:
This application discloses a background subtraction-mediated data dependent acquisition method useful in mass spectrometry analysis. The method includes subtraction of background data from precursor ion spectra of a sample in real-time to obtain mass data of component(s) of interest and performs data-dependent acquisition on the component(s) of interest based on the resultant mass data from the background subtraction step. The present invention also encompasses mass spectrometer systems capable of background subtraction-mediated data-dependent acquisition and computer programs adapted for use in the background-subtraction-mediated data-dependent acquisition. The invention thus provides highly sensitive data-dependent acquisition for minor components of interest in a sample.
Precise And Thorough Background Subtraction
Precise And Thorough Background Subtraction
US Patent:
8304719, Nov 6, 2012
Filed:
Feb 20, 2010
Appl. No.:
12/709474
Inventors:
Xin Wang - Princeton NJ, US
Haiying Zhang - Princeton NJ, US
Haiying Zhang - Princeton NJ, US
International Classification:
H01J 49/00
US Classification:
250288, 250281, 250282
Abstract:
A method for identifying and characterizing components of interest in complex samples includes subjecting both a sample and its control samples to chromatography/high resolution mass spectrometry analysis to detect ions of the samples. The method includes defining sections of control sample data within specified chromatographic fluctuation time and mass precision windows around each ion or each group of the same ions of question in the test sample data. The defined sections of the control sample data are examined and the maximal intensities are subtracted from respective ions in the test sample. Components of interest are determined from the resultant data of the test sample. The method can be used for identifying molecular ions and/or their fragment ions for components of interest in complex samples.