WILLIAM LOGAN KING
Pilots at Richwood Dr, Atlanta, GA

2009025, Oct 15, 2009

Jun 1, 2009

12/475837

Paul E. Sheehan - Springfield VA, US
Lloyd J. Whitman - Alexandria VA, US
William P. King - Atlanta GA, US

B05C 11/00

118667

The present invention describes an apparatus for nanolithography and a process for thermally controlling the deposition of a solid organic “ink” from the tip of an atomic force microscope to a substrate. The invention may be used to turn deposition of the ink to the substrate on or off by either raising its temperature above or lowing its temperature below the ink's melting temperature. This process may be useful as it allows ink deposition to be turned on and off and the deposition rate to change without the tip breaking contact with the substrate. The same tip can then be used for imaging purposes without fear of contamination. This invention can allow ink to be deposited in a vacuum enclosure, and can also allow for greater spatial resolution as the inks used have lower surface mobilities once cooled than those used in other nanolithography methods.

8173525, May 8, 2012

Jun 16, 2006

11/454334

Samuel Graham, Jr. - Lithonia GA, US
William P. King - Atlanta GA, US
Ching-ping Wong - Berkeley Lake GA, US

Georgia Tech Research Corporation - Atlanta GA

H01L 21/00, H01L 21/20

438496, 257E21575, 977707, 977887

Systems and methods of nanomaterial transfer are described. A method of nanomaterial transfer involving fabricating a template and synthesizing nanomaterials on the template. Subsequently, the nanomaterials are transferred to a substrate by pressing the template onto the substrate. In some embodiments, the step of transferring the nanomaterials involves pressing the template onto the substrate such that the nanomaterials are embedded below a surface layer of the substrate. In some embodiments, the temperature of the plurality of nanomaterials is raised to assist the transfer of the nanomaterials to the substrate.

7497613, Mar 3, 2009

Apr 18, 2006

11/405772

William P. King - Atlanta GA, US
Mike Reading - Norwich, GB

Anasys Instruments - Santa Barbara CA

G01K 1/00, G01K 13/00, G01N 23/00, G11B 3/00

374141, 374117, 374164, 369154, 250306

The invention is a heated thermal probe suitable for use in micro-thermal analysis or other high resolution thermal measurements and actions. The probe is, in the preferred embodiment, a microfabricated cantilever with a sharp probe tip of a type used in Scanning Probe Microscopes (SPM's) which further includes an integral resistive heating element. The heating element is formed by doping regions of the cantilever with an ion implant process to make lower resistance connections and a higher resistance heating element. There is no spatial overlap between the base of the probe tip and the heating element or conductors.