DR. WILLIAM H. THOMPSON, M.D.
Osteopathic Medicine at Gala St, Meridian, ID

6376297, Apr 23, 2002

Aug 5, 1999

09/368710

John D. Porter - Meridian ID
William N. Thompson - Meridian ID

Micron Technology, Inc. - Dayton OH

H01L 218234

438238, 438199, 438200, 438202

An SRAM memory cell is provided having a pair of cross-coupled CMOS inverters. The sources of the pull-up transistors forming each of the CMOS inverters are coupled to V through parasitic resistance of the substrate in which each is formed. The source of the p-type pull-up transistor is therefore always at a potential less than or equal to the potential of the N-well such that the emitter-base junction of the parasitic PNP transistor cannot become forward biased and latch-up cannot occur.

6384714, May 7, 2002

Aug 6, 2001

09/922983

William N. Thompson - Meridian ID
John D. Porter - Meridian ID
Larren Gene Weber - Caldwell ID

Micron Technology, Inc. - Boise ID

G05B 100

3401462, 377 26, 377 39, 377 51

A method of finding an unknown value from within a range of values is disclosed that divides the range into weighted subranges and then, beginning with an arbitrary search value within the range, performs a number of simple comparisons to determine the value for each subrange that will result in a match with the target value. This method can also detect those cases where the target value lies outside the range. In one embodiment, the method of finding an unknown value within a range of values is applied to impedance matching. In this embodiment, the output impedance of a pin on an integrated circuit is automatically matched to the impedance of the load connected to it. The output driver has a controllable impedance that can be adjusted within a specific range of impedances to match the external load impedance it is to drive.

6545561, Apr 8, 2003

Aug 14, 2001

09/929571

William N. Thompson - Meridian ID
John D. Porter - Meridian ID
Larren Gene Weber - Caldwell ID

Micron Technology, Inc. - Boise ID

H03H 1130

333 173, 333 32

A method of finding an unknown value from within a range of values is disclosed that divides the range into weighted subranges and then, beginning with an arbitrary search value within the range, performs a number of simple comparisons to determine the value for each subrange that will result in a match with the target value. This method can also detect those cases where the target value lies outside the range. In one embodiment, the method of finding an unknown value within a range of values is applied to impedance matching. In this embodiment, the output impedance of a pin on an integrated circuit is automatically matched to the impedance of the load connected to it. The output driver has a controllable impedance that can be adjusted within a specific range of impedances to match the external load impedance it is to drive.

6275119, Aug 14, 2001

Aug 25, 1999

9/382525

William N. Thompson - Meridian ID
John D. Porter - Meridian ID
Larren Gene Weber - Caldwell ID

Micron Technology, Inc. - Boise ID

H03H 1130, H03H 1128

333 173

A method of finding an unknown value from within a range of values is disclosed that divides the range into weighted subranges and then, beginning with an arbitrary search value within the range, performs a number of simple comparisons to determine the value for each subrange that will result in a match with the target value. This method can also detect those cases where the target value lies outside the range. In one embodiment, the method of finding an unknown value within a range of values is applied to impedance matching. In this embodiment, the output impedance of a pin on an integrated circuit is automatically matched to the impedance of the load connected to it. The output driver has a controllable impedance that can be adjusted within a specific range of impedances to match the external load impedance it is to drive.

6128244, Oct 3, 2000

Jun 4, 1998

9/090167

William N. Thompson - Meridian ID
J. David Porter - Meridian ID
Larren G. Weber - Caldwell ID
John Wilford - Boise ID
Tom Pawlowski - Boise ID

Micron Technology, Inc. - Boise ID

G11C 800

36523003

The invention provides a memory access system and method of operation particularly useful with electronic storage devices having two or more memory units. Accessing of the memory units occurs one at a time and takes place using shared resources, such as shared row and column decoders. In a preferred embodiment, the invention permits the parallel reading of data from one memory unit of a plurality of memory units during a single system clock cycle using shared resources to perform addressing (e. g. , read or write access) for the memory unit. The same shared resources are then used by any one of the other memory units during a subsequent system clock cycle to perform its own access function. By reading (or writing) data from (or to) one memory unit only during a single system clock cycle, the shared row and column decoders (and their attendant address lines) become available in a subsequent system clock cycle for use by another memory unit.

6088278, Jul 11, 2000

Jul 23, 1998

9/121145

John D. Porter - Meridian ID
William N. Thompson - Meridian ID

Micron Technology, Inc. - Boise ID

G11C 700

365208

An apparatus and method for sensing the logical state stored in a memory cell includes a pre-amplifier and a latching sense amplifier. The pre-amplifier receives differential signals from a memory array, shifts the signals and amplifies the differential sufficiently for input to the latching sense amplifier. The gain realized through the pre-amplifier facilitates faster and more reliable sensing of the memory cell state. A method comprises receiving first and second signals representative of a logical state stored in a memory cell, pre-amplifying a difference between the first and second signals to produce third and fourth signals having a greater difference, and amplifying the greater difference to more quickly and reliably produce an output indicative of the logical state stored in the memory cell.

7180386, Feb 20, 2007

Oct 7, 2005

11/246469

William N. Thompson - Meridian ID, US
John D. Porter - Meridian ID, US
Larren Gene Weber - Caldwell ID, US

Micron Technology, Inc. - Boise ID

H03H 11/30

333 173

A method of finding an unknown value from within a range of values is disclosed that divides the range into weighted subranges and then, beginning with an arbitrary search value within the range, performs a number of simple comparisons to determine the value for each subrange that will result in a match with the target value. This method can also detect those cases where the target value lies outside the range. In one embodiment, the method of finding an unknown value within a range of values is applied to impedance matching. In this embodiment, the output impedance of a pin on an integrated circuit is automatically matched to the impedance of the load connected to it. The output driver has a controllable impedance that can be adjusted within a specific range of impedances to match the external load impedance it is to drive.

2005028, Dec 29, 2005

Aug 31, 2005

11/216220

John Porter - Meridian ID, US
William Thompson - Meridian ID, US

H01L021/8234, H01L021/8238

438238000, 438199000, 438210000, 438202000

An SRAM memory cell is provided having a pair of cross-coupled CMOS inverters. The sources of the pull-up transistors forming each of the CMOS inverters are coupled to Vthrough parasitic resistance of the substrate in which each is formed. The source of the p-type pull-up transistor is therefore always at a potential less than or equal to the potential of the N-well such that the emitter-base junction of the parasitic PNP transistor cannot become forward biased and latch-up cannot occur.