William Floyd Hughes
Engineering in Atlanta, GA
License number
Louisiana PE.0006257
Issued Date
Mar 11, 1958
Expiration Date
Dec 31, 1976
Category
Civil Engineer
Address
Address
PO Box 1286, Atlanta, GA 30301
Professional information
William Hughes Jr, Atlanta GA - Lawyer
Address:
West Peachtree St, Atlanta, GA
Work:
Alston & Bird LLP
Specialties:
Arbitration & Mediation, Business Law, Construction Law, ADR/Arbitration, Construction, Corporate & Finance, Energy & Project Finance, General Civil, Litigation
Jurisdiction:
Georgia
Law School:
University of Virginia
Links:
Website
William Hughes Jr, Atlanta GA - Lawyer
Address:
1201 Peachtree St NE, Atlanta, GA 30309
Experience:
43 years
Specialties:
Business Law, Real Estate Law, General Civil
Jurisdiction:
Georgia (1983)
Law School:
University of Virginia
Memberships:
Georgia State Bar (1983)
William H. Hughes Jr., Atlanta GA - Lawyer
Address:
1201 West Peachtree St, Atlanta 30309
(404) 881-7273
(404) 881-7273
Licenses:
Georgia - Active Member in Good Standing 1983
Education:
University of Virginia School of Law
Specialties:
General Practice - 100%
Probe Tips And Method Of Making Same
US Patent:
7408366, Aug 5, 2008
Filed:
Feb 13, 2006
Appl. No.:
11/352535
Inventors:
Zhong L. Wang - Marietta GA, US
William L. Hughes - Atlanta GA, US
Brent A. Buchine - Smyrna GA, US
William L. Hughes - Atlanta GA, US
Brent A. Buchine - Smyrna GA, US
Assignee:
Georgia Tech Research Corporation - Atlanta GA
International Classification:
G01R 31/02
US Classification:
324754
Abstract:
A probe includes a substrate and a tetragonal structure disposed on the substrate that has four end points. Three of the end points are disposed adjacent to the substrate. A fourth of the end points extends outwardly and substantially normal to the substrate. In a method of making a probe tip, a plurality of tetrapods are grown and at least one of the tetrapods is placed on a substrate at a selected location. The tetrapod is affixed to the substrate at the selected location.
Probe Sensor With Multi-Dimensional Optical Grating
US Patent:
7808656, Oct 5, 2010
Filed:
Mar 24, 2010
Appl. No.:
12/730603
Inventors:
Zhong L. Wang - Marietta GA, US
William L. Hughes - Atlanta GA, US
William L. Hughes - Atlanta GA, US
Assignee:
Georgia Tech Research Corporation - Atlanta GA
International Classification:
G01B 11/14
US Classification:
356614, 356622
Abstract:
A displacement sensor employs an electromagnetic radiation source that generates a beam of electromagnetic radiation for measuring a feature of an object. The displacement sensor includes a displacement probe, a multi-dimensional diffraction grating and a plurality of photon detectors. A reflection surface, which is changed when the probe interacts with the object, interacts with the beam from the electromagnetic radiation source and reflects a beam from the reflection surface. The multi-dimensional diffraction grating interacts with the reflected beam and generates a pattern of diffracted beams. Each photon detector senses a different diffracted beam, thereby providing information about the state of the probe.
Method Of Making A Probe Tip
US Patent:
7975363, Jul 12, 2011
Filed:
Jun 10, 2008
Appl. No.:
12/136479
Inventors:
Zhong L. Wang - Marietta GA, US
William L. Hughes - Atlanta GA, US
Brent A. Buchine - Smyrna GA, US
William L. Hughes - Atlanta GA, US
Brent A. Buchine - Smyrna GA, US
Assignee:
Georgia Tech Research Corporation - Atlanta GA
International Classification:
H01S 4/00
US Classification:
295921, 29832, 29831, 29837, 29854, 29857
Abstract:
A probe includes a substrate and a tetragonal structure disposed on the substrate that has four end points. Three of the end points are disposed adjacent to the substrate. A fourth of the end points extends outwardly and substantially normal to the substrate. In a method of making a probe tip, a plurality of tetrapods are grown and at least one of the tetrapods is placed on a substrate at a selected location. The tetrapod is affixed to the substrate at the selected location.
Probe Sensor With Multi-Dimensional Optical Grating
US Patent:
7705999, Apr 27, 2010
Filed:
Mar 7, 2006
Appl. No.:
11/369574
Inventors:
Zhong L. Wang - Marietta GA, US
William L. Hughes - Atlanta GA, US
Brent A. Buchine - Smyrna GA, US
William L. Hughes - Atlanta GA, US
Brent A. Buchine - Smyrna GA, US
Assignee:
Georgia Tech Research Corporation - Atlanta GA
International Classification:
G01B 11/14
US Classification:
356614, 356498
Abstract:
A displacement sensor employs an electromagnetic radiation source that generates a beam of electromagnetic radiation for measuring a feature of an object. The displacement sensor includes a displacement probe, a multi-dimensional diffraction grating and a plurality of photon detectors. A reflection surface, which is changed when the probe interacts with the object, interacts with the beam from the electromagnetic radiation source and reflects a beam from the reflection surface. The multi-dimensional diffraction grating interacts with the reflected beam and generates a pattern of diffracted beams. Each photon detector senses a different diffracted beam, thereby providing information about the state of the probe.