William Eng Lee
Physician at Huron St, Westminster, CO
License number
Colorado 32779
Issued Date
Jul 15, 1993
Renew Date
May 1, 2015
Expiration Date
Apr 30, 2017
Type
Physician
Address
Address
9451 Huron St, Westminster, CO 80260
Professional information
Dr. William E Lee - MD (Doctor of Medicine)
Procedures:
Bone Marrow Aspiration, Chemotherapy, cancer, Hematologic Malignancies, Bone Marrow Biopsy
Hospitals:
Northern Hematology-Oncology
9451 Huron St, Thornton 80260
North Suburban Medical Center
9191 Grant St, Thornton 80229
Exempla Good Samaritan Medical Center
200 Exempla Cir, Lafayette 80026
Exempla Lutheran Medical Center
8300 West 38Th Ave, Wheat Ridge 80033
Platte Valley Medical Center
1600 Prairie Center Pkwy, Brighton 80601
St. Anthony North Hospital
2551 West 84Th Ave, Westminster 80031
Northern Hematology-Oncology
9451 Huron St, Thornton 80260
North Suburban Medical Center
9191 Grant St, Thornton 80229
Exempla Good Samaritan Medical Center
200 Exempla Cir, Lafayette 80026
Exempla Lutheran Medical Center
8300 West 38Th Ave, Wheat Ridge 80033
Platte Valley Medical Center
1600 Prairie Center Pkwy, Brighton 80601
St. Anthony North Hospital
2551 West 84Th Ave, Westminster 80031
9451 Huron St, Thornton 80260
North Suburban Medical Center
9191 Grant St, Thornton 80229
Exempla Good Samaritan Medical Center
200 Exempla Cir, Lafayette 80026
Exempla Lutheran Medical Center
8300 West 38Th Ave, Wheat Ridge 80033
Platte Valley Medical Center
1600 Prairie Center Pkwy, Brighton 80601
St. Anthony North Hospital
2551 West 84Th Ave, Westminster 80031
Northern Hematology-Oncology
9451 Huron St, Thornton 80260
North Suburban Medical Center
9191 Grant St, Thornton 80229
Exempla Good Samaritan Medical Center
200 Exempla Cir, Lafayette 80026
Exempla Lutheran Medical Center
8300 West 38Th Ave, Wheat Ridge 80033
Platte Valley Medical Center
1600 Prairie Center Pkwy, Brighton 80601
St. Anthony North Hospital
2551 West 84Th Ave, Westminster 80031
Education:
Medical Schools
UNIVERSITY OF PITTSBURGH SCHOOL OF MEDICINE
Graduated: 1990
UNIVERSITY OF PITTSBURGH SCHOOL OF MEDICINE
Graduated: 1990
William Lee, Thornton CO
Work:
Northwest Hematology-Oncology
9451 Huron St, Denver, CO 80260
9451 Huron St, Denver, CO 80260
Methods And Devices For Monitoring And Controlling Thin Film Processing
US Patent:
7828929, Nov 9, 2010
Filed:
Dec 21, 2005
Appl. No.:
11/314811
Inventors:
William David Lee - Westminster CO, US
Dale C. Ness - Broomfield CO, US
Alan D. Streater - Boulder CO, US
Dale C. Ness - Broomfield CO, US
Alan D. Streater - Boulder CO, US
Assignee:
Research Electro-Optics, Inc. - Boulder CO
International Classification:
C23F 1/00, H01L 21/306
US Classification:
15634555
Abstract:
Thin film processing systems and methods are provided having a moving deposition sensor capable of translation and/or rotation in a manner that exposes the sensor to thin film deposition environments in a flux region substantially the same as the deposition environments experienced by one or more moveable substrates during a selected deposition period. In one embodiment, a thin film monitoring and control system is provided wherein one or more moveable substrates and a moveable deposition sensor are moved along substantially coincident trajectories in a flux region of a thin film deposition system for a selected deposition period. Systems and methods of the present invention may include SC-cut quartz crystal microbalance sensors capable of excitation of at least two different resonant modes.
Methods And Devices For Monitoring And Controlling Thin Film Processing
US Patent:
8182861, May 22, 2012
Filed:
Oct 12, 2010
Appl. No.:
12/902476
Inventors:
William David Lee - Westminster CO, US
Dale C. Ness - Broomfield CO, US
Alan D. Streater - Boulder CO, US
Dale C. Ness - Broomfield CO, US
Alan D. Streater - Boulder CO, US
Assignee:
Research Electro-Optics, Inc. - Boulder CO
International Classification:
C23C 16/52
US Classification:
427 8, 427 9, 427 10, 4272481, 4272555
Abstract:
Thin film processing systems and methods are provided having a moving deposition sensor capable of translation and/or rotation in a manner that exposes the sensor to thin film deposition environments in a flux region substantially the same as the deposition environments experienced by one or more moveable substrates during a selected deposition period. In one embodiment, a thin film monitoring and control system is provided wherein one or more moveable substrates and a moveable deposition sensor are moved along substantially coincident trajectories in a flux region of a thin film deposition system for a selected deposition period. Systems and methods of the present invention may include SC-cut quartz crystal microbalance sensors capable of excitation of at least two different resonant modes.
Multi-Longitudinal Mode Laser Providing Polarization Control
US Patent:
7787505, Aug 31, 2010
Filed:
Dec 6, 2007
Appl. No.:
11/951409
Inventors:
Quentin A. Turchette - Boulder CO, US
William David Lee - Westminster CO, US
William David Lee - Westminster CO, US
Assignee:
Research Electro-Optics, Inc. - Boulder CO
International Classification:
H01S 3/13
US Classification:
372 29023, 372 93, 372 99, 372107, 372 27
Abstract:
The present invention provides optical configurations, including resonant cavity and laser configurations, and related methods providing deterministic control of the polarization characteristics and frequencies of the radiant output of multi-longitudinal mode lasers, including multi-longitudinal mode gas phase lasers. Polarization control provided by the present invention includes preselection and stabilization of the angular orientations of the polarization planes of electromagnetic radiation generated by a multi-longitudinal mode laser, including preselection and stabilization of orthogonal linear polarization states generated by a dual-longitudinal mode gas phase laser.