WILLIAM DAVID BURTON
Electrician at Ripplebrook Dr, Houston, TX
License number
Texas 101135
Expiration Date
Jun 6, 2017
Category
Journeyman Electrician
Address
Address
5106 Ripplebrook Dr, Houston, TX 77045
Phone
(713) 870-2150
Professional information
Fast Time-Of-Flight Mass Spectrometer With Improved Dynamic Range
US Patent:
7800054, Sep 21, 2010
Filed:
Apr 25, 2008
Appl. No.:
12/110037
Inventors:
Katrin Fuhrer - Bern, CH
Marc Gonin - Bern, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie E. Vaughn - Pearland TX, US
Steven R. Ulrich - Houston TX, US
Marc Gonin - Bern, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie E. Vaughn - Pearland TX, US
Steven R. Ulrich - Houston TX, US
Assignee:
Ionwerks, Inc. - Houston TX
International Classification:
H01J 49/00
US Classification:
250282, 250281, 250283, 250286, 250287, 250397
Abstract:
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
Fast Time-Of-Flight Mass Spectrometer With Improved Data Acquisition System
US Patent:
7084393, Aug 1, 2006
Filed:
Nov 25, 2003
Appl. No.:
10/721438
Inventors:
Katrin Fuhrer - Gunten, CH
Marc Gonin - Gunten, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie Vaughn - Pearland TX, US
Steven Ulrich - Houston TX, US
Marc Gonin - Gunten, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie Vaughn - Pearland TX, US
Steven Ulrich - Houston TX, US
Assignee:
Ionwerks, Inc. - Houston TX
International Classification:
H01J 49/40
US Classification:
250283, 250287
Abstract:
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
Selectively Degradable Passage Restriction
US Patent:
2013004, Feb 21, 2013
Filed:
Aug 17, 2011
Appl. No.:
13/211817
Inventors:
Matthew T. McCoy - Richmond TX, US
Matthew D. Solfronk - Katy TX, US
Jack D. Farmer - Dickinson TX, US
William A. Burton - Houston TX, US
James G. King - Kingwood TX, US
Jason J. Barnard - Katy TX, US
Edward J. O'Malley - Houston TX, US
Matthew D. Solfronk - Katy TX, US
Jack D. Farmer - Dickinson TX, US
William A. Burton - Houston TX, US
James G. King - Kingwood TX, US
Jason J. Barnard - Katy TX, US
Edward J. O'Malley - Houston TX, US
Assignee:
BAKER HUGHES INCORPORATED - Houston TX
International Classification:
E21B 34/06, E21B 23/00
US Classification:
166373, 166194
Abstract:
An actuation system and method, the system including a tubular defining a passage, and an assembly disposed with the tubular, the assembly including a restriction operatively arranged to receive a restrictor for enabling actuation of the assembly, the restriction including a degradable material with a protective layer thereon, the degradable material degrading upon exposure to a fluid in the passage and the protective layer isolating the degradable material from the fluid.
Fast Time-Of-Flight Mass Spectrometer With Improved Data Acquisition System
US Patent:
8492710, Jul 23, 2013
Filed:
Sep 17, 2010
Appl. No.:
12/885064
Inventors:
Katrin Fuhrer - Bern, CH
Marc Gonin - Bern, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie E. Vaughn - Pearland TX, US
Steven R. Ulrich - Houston TX, US
Marc Gonin - Bern, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie E. Vaughn - Pearland TX, US
Steven R. Ulrich - Houston TX, US
Assignee:
Ionwerks, Inc. - Houston TX
International Classification:
H01J 49/00
US Classification:
250287, 250281, 250282, 250283, 250286
Abstract:
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
Fast Time-Of-Flight Mass Spectrometer With Improved Data Acquisition System
US Patent:
7365313, Apr 29, 2008
Filed:
Mar 6, 2006
Appl. No.:
11/368639
Inventors:
Katrin Fuhrer - Bern, CH
Marc Gonin - Bern, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie E. Vaughn - Pearland TX, US
Steven Ulrich - Houston TX, US
Marc Gonin - Bern, CH
Thomas F. Egan - Houston TX, US
William Burton - Houston TX, US
J. Albert Schultz - Houston TX, US
Valerie E. Vaughn - Pearland TX, US
Steven Ulrich - Houston TX, US
Assignee:
Ionwerks - Houston TX
International Classification:
H01J 49/40
US Classification:
250287, 250288, 250281, 250305, 250394
Abstract:
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.