WILLIAM B MILLER, MD
Radiology at Rose Garden Ln, Phoenix, AZ

License number
Arizona 32039
Category
Radiology
Type
Diagnostic Radiology
Address
Address
2323 W Rose Garden Ln, Phoenix, AZ 85027
Phone
(623) 931-7999
(623) 842-5640 (Fax)

Professional information

William Miller Photo 1

Student At Techskills

Location:
Phoenix, Arizona Area
Industry:
Computer Networking
Work:
ServisAir Sep 2004 - Sep 2008 - Ramp Agent Industrial Personnel Jul 2004 - Sep 2004 - General Laborer
Education:
TechSkills 2009 - 2010
North Bend High School 2000
Diploma


William Miller Photo 2

William S Miller - Phoenix, AZ

Work:
AAA MedEx Transportation
Medical Transport Driver
MV Public Transportation - Phoenix, AZ
Transit Operator
Fry's Market Place - Phoenix, AZ
Courtesy Clerk


William B Miller Photo 3

William B Miller, Phoenix AZ

Specialties:
Radiologist
Address:
2323 W Rose Garden Ln, Phoenix, AZ 85027
Education:
Northwestern University, Feinberg School of Medicine - Doctor of Medicine
Board certifications:
American Board of Radiology Certification in Diagnostic Radiology (Radiology)


William B Miller Photo 4

Dr. William B Miller, Phoenix AZ - MD (Doctor of Medicine)

Specialties:
Diagnostic Radiology
Address:
2323 W Rose Garden Ln, Phoenix 85027
(623) 931-7999 (Phone), (623) 842-5640 (Fax)
MRI STE
9003 E Shea Blvd, Scottsdale 85260
(480) 425-5000 (Phone), (480) 425-5033 (Fax)
Languages:
English
Hospitals:
2323 W Rose Garden Ln, Phoenix 85027
MRI STE
9003 E Shea Blvd, Scottsdale 85260
Scottsdale Healthcare - Shea Medical Center
9003 East Shea Blvd, Scottsdale 85260
Education:
Medical School
Northwestern Center Feinberg School of Medicine


William Miller Photo 5

William Miller - Phoenix, AZ

Work:
Self-employed
None
Unemployed
None
EnvironBusiness, Incorporated - Burlington, MA
Project Engineer
Clayton Group Services - Scottsdale, AZ
Project Manager
Aaron and Wright Technical Services, Incorporated - Houston, TX
Consultant
Personal Sabbatical
None
SBA Network Services, Incorporated - Tempe, AZ
Construction Manager
CRA Services - Phoenix, AZ
Project Manager
Asset Environmental Services, Incorporated - Tempe, AZ
Field Operations Manager
Huntingdon Engineering and Environmental / Thomas-Hartig and Associates - Chandler, AZ
Field Inspector
Education:
Arizona State University - Tempe, AZ
Bachelor of Applied Science in Management
Phoenix College - Phoenix, AZ
Associate of Applied Science in Civil Engineering
Moraine Park Technology College - Fond du Lac, WI
Associate in Industrial Engineering


William Miller Photo 6

Semiconductor Characterization And Production Information System

US Patent:
6720194, Apr 13, 2004
Filed:
Oct 2, 2002
Appl. No.:
10/262737
Inventors:
William Miller - Phoenix AZ
Thomas Martis - Chandler AZ
Assignee:
Siverion, Inc. - Tempe AZ
International Classification:
H01L 2166
US Classification:
438 14
Abstract:
A system in accordance with the present invention provides characterization information for semiconductor products. The system includes a plurality of data sources, each providing data pertaining to the products. A server is coupleable to each data source. A database is coupled to the server for storing data from the data sources. An automatic data collection engine at the server automatically collects data from the sources. A characterization engine resident at the server operates on the data to provide characterization information. A reporting application engine operable at the server generates characterization reports from the characterization information. The characterization reports are selectable.


William Miller Photo 7

William Miller

Location:
Phoenix, Arizona Area
Industry:
Computer Software


William Miller Photo 8

System And Method For Determining Product Specification Limits

US Patent:
2005001, Jan 13, 2005
Filed:
Jul 7, 2003
Appl. No.:
10/615418
Inventors:
Edward Nowotny - Austin TX, US
Snehanshu Shah - Austin TX, US
William Miller - Phoenix AZ, US
Thomas Martis - Chandler AZ, US
Assignee:
SIVERION, INC. - Tempe AZ
International Classification:
G06F017/30
US Classification:
707001000
Abstract:
A system and method in accordance with the present invention determines optimal specification limits for product by utilizing the characterization values for parameters of a plurality of known good parts. The known good parts are proportioned based upon a desired yield. The proportioned known good parts are partitioned into to provide a subset. The parameters of the partitioned subset of known good parts are utilized to determine the specification limits of the product.