WEI WANG
Accountancy in Austin, TX
License number
Massachusetts 25879
Issued Date
Aug 21, 2008
Expiration Date
Jun 30, 2018
Type
Certified Public Accountant
Address
Address
Austin, TX 78757
Professional information
Wei Wang
Position:
Software Engineer at Cisco Systems
Location:
Austin, Texas Area
Industry:
Computer Software
Work:
Cisco Systems
- Austin, Texas Area since Nov 2012
-
Software Engineer
Wayne, A GE Energy Business
- Austin, Texas Area Jun 2012 - Oct 2012
-
Sr. Software Engineer
Cisco Systems, Inc.
- Austin, Texas Area Aug 2010 - Jun 2012
-
Software Engineer
NetSpend Corporation
Aug 2009 - Aug 2010
-
Senior Software Enigineer
Accenture
Apr 2009 - Aug 2009
-
Senior Software Engineer
Cisco Systems, Inc.
Feb 2000 - Apr 2009
-
Software Engineer
Integrated Measurement Systems
Jun 1999 - Nov 1999
-
Intern
Jiangsu Provincial Institute for Drug Control, PR China
Sep 1993 - Jun 1998
-
Computer Engineer
Skills:
Perl, JSP, C++, Shell Scripting, SQL, Ant, JDBC, SNMP, Multithreading, XSLT, Windows, Jetty, Tapestry, Java, Linux
Method And System For Calibrating A Rotary Encoder And Making A High Resolution Rotary Encoder
US Patent:
7414547, Aug 19, 2008
Filed:
Dec 22, 2006
Appl. No.:
11/615459
Inventors:
Wei Wang - Austin TX, US
Levent Biyikli - Cedar Park TX, US
Luis A. Aguirre - Austin TX, US
Levent Biyikli - Cedar Park TX, US
Luis A. Aguirre - Austin TX, US
Assignee:
3M Innovative Properties Company - St. Paul MN
International Classification:
H03M 1/22
US Classification:
341 7, 341120
Abstract:
A calibration system for a rotary encoder comprises a rotary encoder disposed on a manufacturing substrate, the rotary encoder including an encoder pattern. The calibration system also includes a calibration pattern written onto a surface of the substrate, the calibration pattern comprising a ring that includes a grating pattern, where a radial position of the grating pattern corresponds to an error value of the position of the encoder pattern. A method of calibrating the errors of a rotary encoder and a method of fabricating a high resolution rotary encoder on a surface of a manufacturing substrate are also provided.
Wei Wang - Austin, TX
Work:
Transcendent Endeavors - Ann Arbor, MI
Associate Developer Acupuncture DIY
Web Developer (Freelance) Scholars International Publishing Corporation - Ann Arbor, MI
Flash Programmer Eastern Michigan University - Ypsilanti, MI
Web Developer
Associate Developer Acupuncture DIY
Web Developer (Freelance) Scholars International Publishing Corporation - Ann Arbor, MI
Flash Programmer Eastern Michigan University - Ypsilanti, MI
Web Developer
Education:
Eastern Michigan University
Master of Science in Computer Science Tianjin University
Bachelor of Engineering in Computer Information Management
Master of Science in Computer Science Tianjin University
Bachelor of Engineering in Computer Information Management
Contactless Optical Probe For Use In Semiconductor Processing Metrology
US Patent:
6856159, Feb 15, 2005
Filed:
Mar 15, 2000
Appl. No.:
10/363347
Inventors:
Norman H. Tolk - Brentwood TN, US
Gunter Leupke - Williamsburg VA, US
Wei Wang - Austin TX, US
Gunter Leupke - Williamsburg VA, US
Wei Wang - Austin TX, US
Assignee:
Vanderbilt University - Nashville TN
International Classification:
G01R031/02
US Classification:
324765, 324752
Abstract:
A method and/or device () for determining first and second band offsets () at a semiconductor/dielectric heterointerface (), which includes the semiconductor/dielectric heterointerface () exposed to incident photons () from a light source (); a detector () for generating a signal by detecting emitted photons () from the semiconductor/dielectric heterointerface (); and an element () for changing the energy of incident photons () to monitor the first and second band offsets ().
Wei Wang
Location:
Austin, Texas Area
Industry:
Legislative Office