DR. WEI LI, M.D.
Osteopathic Medicine at 7 St, Cedar Rapids, IA
License number
Iowa 40760
Category
Osteopathic Medicine
Type
Internal Medicine
Address
Address
2
543 7Th St SE, Cedar Rapids, IA 52401
707 13Th Ave, Iowa City, IA 52241
707 13Th Ave, Iowa City, IA 52241
Phone
(319) 861-7600
(862) 252-1281
(862) 252-1281
Professional information
Wei Li, Short Hills NJ
Specialties:
Internist
Address:
806 Morris Tpke, Short Hills, NJ 07078
66 W Gilbert St, Tinton Falls, NJ 07701
543 7Th St Se, Cedar Rapids, IA 52401
66 W Gilbert St, Tinton Falls, NJ 07701
543 7Th St Se, Cedar Rapids, IA 52401
Education:
Peking University, Medical College - Doctor of Medicine
Mountainside Hospital - Residency - Internal Medicine
Mountainside Hospital - Residency - Internal Medicine
Board certifications:
American Board of Internal Medicine Certification in Internal Medicine
Dr. Wei Li, Cedar Rapids IA - MD (Doctor of Medicine)
Specialties:
Internal Medicine
Address:
Internists Associates Of Iowa
543 7Th St SE, Cedar Rapids 52401
(319) 861-7600 (Phone)
543 7Th St SE, Cedar Rapids 52401
(319) 861-7600 (Phone)
Languages:
English
Education:
Medical School
Peking Union Medical College of Beijing
Peking Union Medical College of Beijing
Dr. Wei Li, Cleveland OH - MD (Doctor of Medicine)
Specialties:
Family Medicine
Address:
9500 Euclid Ave, Cleveland 44195
(216) 445-9767 (Phone)
2700 Coral Ridge Ave, Coralville 52241
1466 Sequoia Dr, Lake Arrowhead 92352
(909) 336-5969 (Phone)
(216) 445-9767 (Phone)
2700 Coral Ridge Ave, Coralville 52241
1466 Sequoia Dr, Lake Arrowhead 92352
(909) 336-5969 (Phone)
Languages:
English
Education:
Medical School
Harbin Medical University
Graduated: 1983
University Of Ne Med Center
Harbin Medical University
Graduated: 1983
University Of Ne Med Center
Restricted Scan Reordering Technique To Enhance Delay Fault Coverage
US Patent:
7188323, Mar 6, 2007
Filed:
Jul 15, 2004
Appl. No.:
10/892022
Inventors:
Seongmoon Wang - Plainsboro NJ, US
Wei Li - Iowa City IA, US
Srimat T. Chakradhar - Manalapan NJ, US
Wei Li - Iowa City IA, US
Srimat T. Chakradhar - Manalapan NJ, US
Assignee:
NEC Laboratories America, Inc. - Princeton NJ
International Classification:
G06F 17/50
US Classification:
716 4, 716 5, 716 1
Abstract:
Disclosed is a method and apparatus for improved delay fault testing by optimizing the order of scan cells in a scan chain. The order of the scan cells is determined by using a cost value for an order of scan cells, the cost value being computed from costs assigned to orderings of individual pairs of scan cells. These costs can be based on the number of faults that are untestable when the pair of scan cells are placed consecutively in the scan chain. The disclosed techniques allow for enhanced delay fault coverage by rearranging scan flip-flops without increasing routing overhead.