VLADIMIR A ZILBERSTEIN
Engineering in Boston, MA

License number
Massachusetts 31234
Issued Date
Jan 28, 1983
Expiration Date
Jun 30, 2014
Type
Metallurgical Engineer
Address
Address
Boston, MA 02467

Professional information

Vladimir Zilberstein Photo 1

Fluid Supports For Sensors

US Patent:
6798198, Sep 28, 2004
Filed:
Jan 21, 2003
Appl. No.:
10/348339
Inventors:
Vladimir Tsukernik - West Roxbury MA
Neil J. Goldfine - Newton MA
Andrew P. Washabaugh - Chula Vista CA
Darrell E. Schlicker - Watertown MA
Karen E. Walrath - Arlington MA
Eric Hill - Watertown MA
Vladimir A. Zilberstein - Chestnut Hill MA
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N 2782
US Classification:
324262, 324261, 324238, 324220, 324242, 324219
Abstract:
Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.


Vladimir Zilberstein Photo 2

Magnetic Field Characterization Of Stresses And Properties In Materials

US Patent:
2004005, Mar 25, 2004
Filed:
May 20, 2003
Appl. No.:
10/441976
Inventors:
Neil Goldfine - Newton MA, US
Ian Shay - Cambridge MA, US
Darrell Schlicker - Watertown MA, US
Andrew Washabaugh - Chula Vista CA, US
David Grundy - Reading MA, US
Robert Lyons - Boston MA, US
Vladimir Zilberstein - Chestnut Hill MA, US
Vladimir Tsukernik - West Roxbury MA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N027/72, G01R033/12
US Classification:
324/239000, 324/240000, 324/242000
Abstract:
Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.


Vladimir Zilberstein Photo 3

Material Condition Monitoring With Multiple Sensing Modes

US Patent:
7451657, Nov 18, 2008
Filed:
Jan 14, 2005
Appl. No.:
11/036780
Inventors:
Neil J. Goldfine - Newton MA, US
Darrell E. Schlicker - Watertown MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Volker Weiss - Syracuse NY, US
Christopher A. Craven - Bedford MA, US
Ian C. Shay - Waltham MA, US
David C. Grundy - Reading MA, US
Karen E. Walrath - Arlington MA, US
Robert J. Lyons - Boston MA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01B 5/30
US Classification:
73760, 324228
Abstract:
Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history. Methods are also described for measuring the stress in the material by independently estimating effective electrical properties, such as magnetic permeability or electrical conductivity, using layered models or predetermined spatial distributions with depth that are then correlated with the stress.


Vladimir Zilberstein Photo 4

Surface Mounted And Scanning Spatially Periodic Eddy-Current Sensor Arrays

US Patent:
6952095, Oct 4, 2005
Filed:
Sep 20, 2000
Appl. No.:
09/666524
Inventors:
Neil J. Goldfine - Newton MA, US
Darrell E. Schlicker - Watertown MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Vladimir Tsukernik - West Roxbury MA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N027/82, G01N027/72, G01R033/12
US Classification:
324240, 324242, 324243, 324202
Abstract:
Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided every other half wavelength may be connected together in series while the sensing elements in adjacent half wavelengths are spatially offset. Certain sensors include circular segments which create a circularly symmetric magnetic field that is periodic in the radial direction. Such sensors are particularly adapted to surround fasteners to detect cracks and can be mounted beneath a fastener head. In another sensor, sensing windings are offset along the length of parallel winding segments to provide material measurements over different locations when the circuit is scanned over the test material. The distance from the sensing elements to the ends of the primary winding may be kept constant as the offset space in between sensing elements is varied.


Vladimir Zilberstein Photo 5

Hybrid Wound/Etched Winding Constructs For Scanning And Monitoring

US Patent:
7518360, Apr 14, 2009
Filed:
Jun 1, 2007
Appl. No.:
11/809555
Inventors:
Neil J. Goldfine - Newton MA, US
Darrell E. Schlicker - Watertown MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Ian C. Shav - Cambridge MA, US
Mark D. Windoloski - Burlington MA, US
Christopher Root - Somerville MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
David C. Grundy - Reading MA, US
Vladimir Tsukernik - West Roxbury MA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N 27/82, G01R 33/12
US Classification:
324240, 324242, 324234, 324238
Abstract:
Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.


Vladimir Zilberstein Photo 6

Hybrid Wound/Etched Winding Constructs For Scanning And Monitoring

US Patent:
2005000, Jan 13, 2005
Filed:
May 24, 2004
Appl. No.:
10/853009
Inventors:
Neil Goldfine - Newton MA, US
Darrell Schlicker - Watertown MA, US
Andrew Washabaugh - Chula Vista CA, US
Ian Shay - Cambrige MA, US
Mark Windoloski - Burlington MA, US
Christopher Root - Somerville MA, US
Vladimir Zilberstein - Chestnut Hill MA, US
David Grundy - Reading MA, US
Vladimir Tsukernik - West Roxbury MA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N027/72
US Classification:
324228000
Abstract:
Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.


Vladimir Zilberstein Photo 7

High Resolution Inductive Sensor Arrays For Material And Defect Characterization Of Welds

US Patent:
6995557, Feb 7, 2006
Filed:
Feb 27, 2004
Appl. No.:
10/788526
Inventors:
Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Darrell E. Schlicker - Watertown MA, US
David C. Grundy - Reading MA, US
Ian Shay - Cambridge MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N 27/82, G01R 33/12
US Classification:
324232, 324240
Abstract:
A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.


Vladimir Zilberstein Photo 8

Damage Tolerance Using Adaptive Model-Based Methods

US Patent:
2004022, Nov 11, 2004
Filed:
Jan 22, 2004
Appl. No.:
10/763573
Inventors:
Neil Goldfine - Newton MA, US
Vladimir Zilberstein - Chestnut Hill MA, US
David Grundy - Reading MA, US
Andrew Washabaugh - Chula Vista CA, US
Assignee:
Jentek Sensors, Inc. - Waltham MA
International Classification:
G06F015/00
US Classification:
702/183000
Abstract:
A model based framework utilizing a vector of multiple material states integrates nondestructive evaluation methods that provide observability of precursor and damage states with health control actions to reduce sustainment costs and extend component lifetimes. This evaluation includes usage monitoring and onboard diagnostics to ensure damage state observability. With an adaptive damage tolerance model, a set of precursor and damage states are assumed. Monitoring of precursor states, early damage detection, and observable health control actions, combined with onboard diagnostics, permit reduced costs and ensure readiness.


Vladimir Zilberstein Photo 9

Applied And Residual Stress Measurements Using Magnetic Field Sensors

US Patent:
7526964, May 5, 2009
Filed:
Jan 24, 2003
Appl. No.:
10/351978
Inventors:
Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
James M. Fisher - Centerville GA, US
David C. Grundy - Reading MA, US
Darrell E. Schlicker - Watertown MA, US
Vladimir Tsukernik - West Roxbury MA, US
Robert J. Lyons - Boston MA, US
Ian C. Shay - Cambridge MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N 3/32
US Classification:
73779
Abstract:
Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.


Vladimir Zilberstein Photo 10

Weld Characterization Using Eddy Current Sensors And Arrays

US Patent:
2005001, Jan 27, 2005
Filed:
Jun 9, 2004
Appl. No.:
10/864297
Inventors:
Neil Goldfine - Newton MA, US
David Grundy - Reading MA, US
Vladimir Zilberstein - Chestnut Hill MA, US
Mark Windoloski - Burlington MA, US
Darrell Schlicker - Watertown MA, US
Andrew Washabaugh - Chula Vista CA, US
Assignee:
JENTEK Sensors, Inc. - Waltham MA
International Classification:
G01N027/82
US Classification:
324240000
Abstract:
Eddy current sensors and sensor arrays are used to characterize welds and the welding process schedule or parameters. A sensor or sensor array is placed in proximity to the test material, such as a lap joint or a butt weld, and translated over the weld region. Effective properties associated with the test material and sensor, such as an electrical conductivity or lift-off, are obtained for the weld region and the base material at a distant location from the weld region. The effective properties or features obtained from the effective property variation with position across the weld are used to assess the welding process parameters.