Inventors:
David M. Boyd - Palmyra PA
Daniel L. Barwick - Palmyra PA
Dennis H. Chestnut - Harrisburg PA
Timothy W. Jones - Lancaster PA
Douglas M. Walburn - Harrisburg PA
Larry J. Wilt - Harrisburg PA
Assignee:
AMP Incorporated - Harrisburg PA
International Classification:
G01B 710
Abstract:
A thickness monitoring system for measuring the thickness of layer disposed on both sides of a two sided strip includes a thickness measuring device, a first set of guide rollers mounted to guide the strip past the thickness measuring device along a first path, a set of guide pulleys mounted to invert the strip and to offset the strip laterally with respect to the first path, and a second set of guide rollers which guide the inverted strip past the thickness measuring device along the second path. The thickness measuring device is mounted for movement along a third path which is transverse to the first and second paths to allow the thickness measuring device to monitor either side of the strip by positioning the measuring device in alignment with the respective one of the first and second paths.