Inventors:
Steven L. Goodman - Madison WI, US
Thomas F. Kelly - Madison WI, US
Terri J. Tomicki - Janesville WI, US
International Classification:
C40B 30/00, C12Q 1/70, C12Q 1/02, G01N 1/00, C40B 50/14
US Classification:
506 7, 435 5, 435 29, 436176, 506 30
Abstract:
The present invention relates to specimens for use in microanalysis processes. One aspect of the invention is directed toward using a mold to form specimens for a microanalysis process (e.g., including an atom probe and/or transmission electron microscope processes). Other aspects of the invention are directed towards embedding specimen material (e.g., including nanoparticles) in an embedment material to produce a specimen suitable for use in a microanalysis process. Still other aspects include combining specimen material with an embedment material to enhance a microanalysis process. Yet other embodiments of the invention are directed toward combining a specimen material with multiple embedment materials to produce specimens suitable for a microanalysis process. Further aspects of the invention are directed toward analyzing at least a portion of a specimen produced by one or more of the processes discussed above.