STEVEN ROBERT PAYNE
Pilots at Pne St, Beaverton, OR
License number
Oregon A2942061
Issued Date
Mar 2017
Expiration Date
Mar 2019
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
5208 SE Pine St, Beaverton, OR 97123
Professional information
Steven Payne - Beaverton, OR
Work:
Columbia Helicopters
Shop Operations Western Partitions, INC - Tigard, OR
Laborer Precision Cast-Parts Corporation - Portland, OR
Floor Person Zach's Masonries - Gresham, OR
Laborer
Shop Operations Western Partitions, INC - Tigard, OR
Laborer Precision Cast-Parts Corporation - Portland, OR
Floor Person Zach's Masonries - Gresham, OR
Laborer
Test System For Integrated Circuits With Serdes Ports
US Patent:
7058535, Jun 6, 2006
Filed:
Feb 12, 2004
Appl. No.:
10/778463
Inventors:
Gordon Edward Chenoweth - Portland OR, US
Marc P. Loranger - Livermore CA, US
Steven Robert Payne - Hillsboro OR, US
James Kaylor Larson - Portland OR, US
Patricia Renee Justice - Portland OR, US
Marc P. Loranger - Livermore CA, US
Steven Robert Payne - Hillsboro OR, US
James Kaylor Larson - Portland OR, US
Patricia Renee Justice - Portland OR, US
Assignee:
Credence Systems Corporation - Milpitas CA
International Classification:
G06F 19/00
US Classification:
702118
Abstract:
A system for testing an integrated circuit device under test (DUT) communicating though synchronous digital signals and through a high speed serialization/de-serialization (serdes) bus includes a serdes interface circuit for communicating with the DUT via the serdes bus and an integrated circuit (IC) tester for communicating with the DUT and with the serdes interface circuit via digital signals. State changes in the digital signals are synchronized to a clock signal within the IC tester. The serdes interface circuit receives instructions from the IC tester via at least one of the digital signals and responds to the instructions by transmitting data to the DUT via the serdes bus using appropriate serdes protocol, by receiving and storing data transmitted by the DUT via the serdes bus, and by thereafter forwarding the stored data to the IC tester via at least one of the digital signals.