Inventors:
Edwin Zane Brown - Westminster CO
Roger Alan Merriman - Lakewood CO
Steven Todd Brandenburg - Broomfield CO
Assignee:
Avaya Technology Corp. - Basking Ridge NJ
International Classification:
G01M 1900
US Classification:
702123, 702122, 702119, 702120
Abstract:
An automated test system for testing a device under test includes a storage device, an input device, a processor, and a test apparatus. The storage device is operable to store a plurality of sets of test parameters, and is further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters. The input device is operable to obtain input from an operator defining a first product model identifier from the plurality of product model identifiers. The processor is coupled to the input device and the storage device and is operable to receive the input from the input device and retrieve the set of test parameters associated with the first product model identifier from the storage device based on the input. The processor is further operable to generate a control signal that includes the retrieved set of test parameters. The test apparatus includes a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device.