Inventors:
Steven Fahrner - Chandler AZ, US
Daniel Marcus - Tempe AZ, US
James L. Jaquette - Mesa AZ, US
Assignee:
Interconnect Devices Inc. - Kansas City KS
International Classification:
G01R 31/28
Abstract:
A test socket comprises a test socket body with a central opening configured to receive a device under test (DUT) including at least one arm opening in the test socket body; and at least one rotating arm disposed in the arm opening.