Inventors:
Stephen S. Sturges - Portland OR, US
Brad Inman - Hillsboro OR, US
Robert C. Hash - Hillsboro OR, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G01R 31/00, G01R 31/14
Abstract:
Low cost test for Integrated Circuits or electrical modules using a reconfigurable logic device is described. In one embodiment, the invention includes configuring a reconfigurable logic device to comply with input standards of a device under test, applying test signals to the device under test, detecting output results of the device under test, and analyzing the detected output results.