Inventors:
Mark Rutenberg - Suffern NY, US
Drore Eisen - Cincinnati OH, US
Stephen Frist - Monsey NY, US
Donald Kristt - Petach Tikvah, IL
International Classification:
C12Q001/68, G01N033/567, G06F019/00, G01N033/48, G01N033/50
US Classification:
435/006000, 435/007210, 702/019000, 702/020000, 435/040500
Abstract:
A system to detect epithelial dysplasia is disclosed by examining cells obtained by a non-lacerational trans-epithelial device. The system selects suspect cells based on abnormal morphology, cytometry and/or using molecular diagnostic techniques. In a preferred embodiment, the results of the computer analysis are displayed as a histogram and the images of the suspect cells are reviewed for DNA ploidy by a pathologist on a cell by cell basis.