Inventors:
Sean P. Gorman - Arlington VA, US
Rajendra G. I. Kulkarni - Fredericksburg VA, US
Laurie Schintler - Fairfax VA, US
Roger R. Stough - Centreville VA, US
International Classification:
G06F 15/173, H04L 12/28
Abstract:
Systems and methods for analyzing the structure of logical networks. Embodiments of the invention include ranking critical nodes according to regional hierarchies, distance hierarchies, global hierarchies, and relay hierarchies. Embodiments of the present invention are capable of testing the effectiveness of such hierarchies. In addition, critical nodes may be used to define critical regions.