SCOTT ADAM DZIAK
Pilots at Cinquefoil Ln, Fort Collins, CO

2013014, Jun 13, 2013

Nov 30, 2012

13/690435

LSI Corporation - Milpitas CA, US
Erich F. Haratsch - Bethlehem PA, US
Jason S. Goldberg - St. Paul MN, US
Kurt J. Worrell - Berthoud CO, US
Scott M. Dziak - Fort Collins CO, US
Jeffrey P. Grundvig - Loveland CO, US

LSI Corporation - Milpitas CA

G11B 27/36

360 55

A contact event between a sensing device and a storage medium is detected by receiving a signal indicating a physical proximity between the sensing device and the storage medium; generating a plurality of frequency bin outputs; comparing one or more frequency bin outputs to a corresponding first level threshold to yield a corresponding comparator output; summing the comparator output with at least one prior instance of the comparator output to yield an aggregated value; comparing the aggregated value to an aggregate threshold to yield an aggregate output; and generating a contact event output if one or more of a first group of the plurality of frequency bin outputs has an associated aggregate output set to a predefined binary value and a predefined minimum number of a second group of the plurality of frequency bin outputs has an associated aggregate output set to a predefined binary value.

8139457, Mar 20, 2012

Sep 23, 2008

12/236148

Yang Cao - Longmont CO, US
Scott M. Dziak - Fort Collins CO, US
Nayak Ratnakar Aravind - Lancaster PA, US
Richard Rauschmayer - Longmont CO, US
Weijun Tan - Longmont CO, US

Agere Systems Inc. - Allentown PA

G11B 20/18

369 5316

Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.

8610608, Dec 17, 2013

Mar 8, 2012

13/415430

Nayak Ratnakar Aravind - Allentown PA, US
Scott M. Dziak - Fort Collins CO, US
Haitao Xia - San Jose CA, US

LSI Corporation - San Jose CA

H03M 1/06

341118, 360 51, 360134, 360 46, 360 53

Various embodiments of the present invention provide systems and methods for data processing. For example, a data processing circuit is discussed that includes: a data detector circuit, a low latency detection circuit, and an error calculation circuit. The data detector circuit is operable to perform a data detection process on a first signal derived from a data input to yield a detected output, and to provide a loop error as a difference between the detected output and the first signal. The low latency detection circuit operable to process a second signal derived from the data input to yield a fast detector output, and to provide a generated error as a difference between the fast detector output and the second signal. The error calculation circuit is operable to calculate an error value based at least in part on the generated error and the loop error.

2010008, Apr 8, 2010

Oct 8, 2008

12/247378

George Mathew - San Jose CA, US
Yuan Xing Lee - San Jose CA, US
Hongwei Song - Longmont CO, US
David L. Parker - Firestone CO, US
Scott M. Dziak - Fort Collins CO, US

G06F 7/38, G06F 7/50, G06F 7/52

708445, 708670, 708620

Various embodiments of the present invention provide systems and methods for estimating signal and noise powers in a received signal set. For example, one embodiment of the present invention provides a method for determining signal power and noise power. The method uses a storage medium that includes a N×Ndata pattern. The N×Ndata pattern includes Nbits repeated Ntimes. Both Nand Nare each greater than one. The methods further include performing an initial read of the N×Ndata pattern, which is stored to a first register. Nsubsequent reads of the N×Ndata pattern are each processed by: performing a subsequent read of the N×Ndata pattern, and performing a difference calculation using the initial read of the N×Ndata pattern and the subsequent read of the N×Ndata pattern and resulting in the calculation of a difference vector that is stored to a second register; and performing a difference accumulation calculation to generate an accumulation vector which is stored to a third register. Based at least in part on the stored N×Ndata pattern and the stored difference vector, an electronics noise power is calculated.

2013020, Aug 8, 2013

Feb 8, 2012

13/368599

Yang Cao - Longmont CO, US
Scott M. Dziak - Fort Collins CO, US
Nayak Ratnakar Aravind - Lancaster PA, US
Richard Rauschmayer - Longmont CO, US
Weijun Tan - Longmont CO, US

G06F 11/07

714799, 714E11024

Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.

2014003, Feb 6, 2014

Aug 2, 2012

13/564763

Haotian Zhang - Longmont CO, US
Scott Michael Dziak - Fort Collins CO, US
Haitao Xia - San Jose CA, US

LSI CORPORATION - Milpitas CA

G11B 5/03

360 66, G9B 5031

A method and system for estimating a zero gain start (ZGS) bias in a read channel is disclosed. The method may include: receiving preamble samples within a fixed-length window selected for ZGS calculation; calculating an energy associated with a 2T frequency in the preamble samples; calculating an energy associated with non-2T frequencies in the preamble samples; and calculating the ZGS bias based on the energy associated with the 2T frequency in the preamble samples and the energy associated with non-2T frequencies in the preamble samples.

7952824, May 31, 2011

Mar 6, 2009

12/399679

Scott M. Dziak - Fort Collins CO, US
Nayak Ratnakar Aravind - Lancaster PA, US

Agere Systems Inc. - Allentown PA

G11B 27/36

360 31

Various embodiments of the present invention provide systems and methods for storage medium flaw detection. For example, some embodiments provide flaw detection systems that include an input circuit, a data processing circuit and a defect detection circuit. The input circuit is operable to receive an input signal and to provide a filtered output. The data processing circuit is operable to receive the filtered output and to compute a difference between the filtered output and an expected output, and the defect detection circuit receives the difference between the filtered output and the expected output and compares a derivative of the difference with a threshold value, and asserts a defect signal when a magnitude of the derivative of the difference exceeds a threshold value.