ROBERT WILLIAM PROULX
Pilots at New Bedford Dr, Fort Collins, CO

License number

Colorado A3855543

Issued Date

Dec 2016

Expiration Date

Dec 2017

Professional information

Apparatus And Method For Changing The Behavior Of A Computer Program While Retaining Control Of Program Execution

US Patent:

5495578, Feb 27, 1996

Filed:

Feb 21, 1995

Appl. No.:

8/390949

Inventors:

John G. Rohrbaugh - Fort Collins CO
Thomas H. Baker - Loveland CO
Michael J. Bennett - Wellington CO
Mercedes E. Gil - Fort Collins CO
Robert W. Proulx - Fort Collins CO

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G06F 1100

US Classification:

39518504

Abstract:

A system comprises a flag interface module, a flag query having a selectable value based on a user authorization level, a query communicator, and a flag value communicator for communicating a new flag value from the flag interface module to a test program in response to the query communicator that enables a user to modify an execution sequence [e. g. , modifying the flow] of the test program executing on a computer controlling a testing system. The execution sequence of the test program is modified only if the user has a proper authorization level. The execution sequence is modified by an authorized user without requiring the test program to be recompiled.

System And Method For Disabling Static Current Paths In Fuse Logic

US Patent:

5663902, Sep 2, 1997

Filed:

Jul 18, 1996

Appl. No.:

8/683485

Inventors:

Michael J. Bennett - Timnath CO
Robert W. Proulx - Fort Collins CO

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G11C 1700

US Classification:

365 96

Abstract:

A programmable fuse circuit is provided with a disabling static current path. The fuse logic circuit includes a controllable switch, load device, and at least one fuse, all of which are connected in a series so as to share a static current path. The controllable switch is preferably a transistor and can be selectively controlled to enable or disable the current path of the programmable fuse circuit. Therefore, by providing the ability to disable the static current path of programmable fuse circuit without having to blow the fuse makes the programmable fuse circuit static current testable. Other applications for the programmable fuse circuit include, for instance, providing a serial number to integrated circuits.

Apparatus And Method For Obtaining A List Of Numbers Of Wafers For Integrated Circuit Testing

US Patent:

5381344, Jan 10, 1995

Filed:

Apr 6, 1992

Appl. No.:

7/863257

Inventors:

John G. Rohrbaugh - Fort Collins CO
Thomas H. Baker - Loveland CO
Michael J. Bennett - Wellington CO
Mercedes P. Gil - Fort Collins CO
Robert W. Proulx - Fort Collins CO

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G06F 1546

US Classification:

364490

Abstract:

The invention is a method for enabling a user to enter wafer numbers into a computer-based integrated circuit production test system. The method comprises the steps of: (a) prompting the user for the wafer numbers; (b) displaying the wafer numbers in a graphical representation of a wafer cassette; (c) enabling the user to edit the wafer numbers on the graphical representation; and (d) transmitting the wafer numbers to the computer-based IC production test system.

Apparatus And Method For Displaying Wafer Test Results In Real Time

US Patent:

5390131, Feb 14, 1995

Filed:

Apr 6, 1992

Appl. No.:

7/863253

Inventors:

John G. Rohrbaugh - Fort Collins CO
Thomas H. Baker - Loveland CO
Michael J. Bennett - Wellington CO
Mercedes E. Gil - Fort Collins CO
Robert W. Proulx - Fort Collins CO

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G06F 1100

US Classification:

364490

Abstract:

The invention is a method for displaying wafer test results from an integrated circuit tester in real time. The method comprising the steps of: (a) receiving wafer dimensions and die dimensions from a wafer handler; (b) creating a template representative of a wafer having cells representative of a die from the wafer dimensions and the die dimensions; (c) displaying the template; (d) invoking a tester to test a selected die of a selected wafer; (e) receiving test results from the tester; (f) displaying the test results on a selected cell which corresponds to the selected die; and (g) repeating steps (d)-(f) as required.

Apparatus And Method For Specifying The Flow Of Test Execution And The Binning For A Testing System

US Patent:

5400263, Mar 21, 1995

Filed:

Apr 6, 1992

Appl. No.:

7/863252

Inventors:

John G. Rohrbaugh - Fort Collins CO
Thomas H. Baker - Loveland CO
Michael J. Bennett - Wellington CO
Mercedes E. Gil - Fort Collins CO
Robert W. Proulx - Fort Collins CO

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G06F 1500

US Classification:

364490

Abstract:

The present invention is a method for specifying test flow and binning of an integrated circuit part in an integrated circuit tester. The method comprises the steps of receiving descriptions of the tests, receiving test flow statements indicating when the tests are to be executed, receiving binning statements, executing the tests as indicated by the test flow statements, and binning the IC device as indicated by the results of the tests.

File Locking

US Patent:

2005025, Nov 10, 2005

Filed:

May 5, 2004

Appl. No.:

10/839683

Inventors:

Keith Schwols - Fort Collins CO, US
George Robbert - Ft. Collins CO, US
Robert Proulx - Fort Collins CO, US

International Classification:

G06F007/00

US Classification:

707200000

Abstract:

An information file is inspected for an identity of a locking service associated with a desired file. The locking service is contacted, and the locking service grants access if the desired file is available.