ROBERT RICHARD COLLINS
Pilots at 2 St, Seattle, WA
License number
Washington A0361307
Issued Date
Jan 2017
Expiration Date
Jul 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
4814 NE 2Nd St, Seattle, WA 98059
Personal information
See more information about ROBERT RICHARD COLLINS at radaris.comName
Address
Phone
5015 17Th Ave NE, Seattle, WA 98105
Professional information
Robert Collins
Location:
Greater Seattle Area
Industry:
Information Technology and Services
Skills:
Risk Management, Finance, Technology Management, Valuation, Managerial Finance, Financial Risk, Portfolio Management, Strategy, Executive Management, Project Management, Leadership, Internal Controls, Forecasting, Enterprise Software, Financial Analysis, Process Improvement, Analysis, Business Analysis, Management
Robert Richard Collins
Location:
Greater Seattle Area
Industry:
Airlines/Aviation
Work:
American Airlines
1987 - 2011
-
Captain
Quebecair
1974 - 1986
-
Airline Pilot
Independent Recreational Facilities And Services Professional
Location:
Greater Seattle Area
Industry:
Recreational Facilities and Services
Owner, Hcco
Position:
Owner at HCCO
Location:
Greater Seattle Area
Industry:
Construction
Work:
HCCO
-
Owner
Integrated Circuit Test Result Communication
US Patent:
2007022, Sep 27, 2007
Filed:
Sep 6, 2006
Appl. No.:
11/470526
Inventors:
Anthony Stoughton - Seattle WA, US
Michael Manley - Seattle WA, US
Christopher Segura - Seattle WA, US
Ronald Lee Koepp - Seattle WA, US
Ernest Allen - Seattle WA, US
Andrew E. Horch - Seattle WA, US
Robert C. Collins - Seattle WA, US
Michael Manley - Seattle WA, US
Christopher Segura - Seattle WA, US
Ronald Lee Koepp - Seattle WA, US
Ernest Allen - Seattle WA, US
Andrew E. Horch - Seattle WA, US
Robert C. Collins - Seattle WA, US
International Classification:
G01R 31/28, H01R 43/00, H04Q 5/22, G08B 13/14
US Classification:
29593, 29825, 3405721, 340 101
Abstract:
A chip has formed thereon integrated circuit elements, which include a main circuit and an associated non volatile memory structure. A test result associated with prior testing of a function of the main circuit is stored in the non volatile memory structure. Additional apparatus and methods are disclosed.