ROBERT MITCHELL RUSSELL, MD
Osteopathic Medicine in Boston, MA

4342957, Aug 3, 1982

Mar 28, 1980

6/134808

Robert J. Russell - South Boston MA

Honeywell Information Systems Inc. - Waltham MA

G01R 3102, G01R 1512

324 73R

An apparatus and method for determining whether test probes of a test fixture on an automatic test equipment (ATE) device are in contact with the intended test points on an electronic assembly under test. The undetected failure of the test probes to contact the test points on the electronic assembly test, such as a printed circuit board can result in meaningless test results or lead to unnecessary further testing or replacement of nonfaulty components that tested as failed. The apparatus and method are directed to detecting which test probes are not in contact with their corresponding test points on the electronic assembly undergoing test by ATE.

4342958, Aug 3, 1982

Mar 28, 1980

6/134809

Robert J. Russell - South Boston MA

Honeywell Information Systems Inc. - Waltham MA

G01R 3102, G01R 1512

324 73R

A method for determining whether test probes of a test fixture on an automatic test equipment (ATE) device are in contact with the intended test points on an electronic assembly under test. The undetected failure of the test probes to contact the test points on the electronic assembly test, such as a printed circuit board can result in meaningless test results or lead to unnecessary further testing or replacement of nonfaulty components that tested as failed. The method is directed to detecting which test probes are not in contact with their corresponding test points on the electronic assembly undergoing test by ATE.

7730375, Jun 1, 2010

Jun 25, 2007

11/768092

Robert J. Russell - South Boston MA, US

G01R 31/3177, G01R 31/42

714733, 714718

A method and apparatus allows externally selecting a functional operation mode or one of a plurality of test operation modes of an electronic device, and in particular a volatile or non-volatile memory device, without the need for additional device connections. One variation of the method and apparatus allows unlimited switching between modes. Another variation of the method and apparatus limits test operation mode selection except at the time of powering up of the device. In either variation, mode selection is based on internally detected stimulus externally applied to the device that would not be present during normal functional operation of the device. Operation of the present invention is essentially transparent in applications where test operations are not utilized, making a device incorporating the present invention compatible with previous versions of the device where the present invention and test operation modes, such as IEEE P1581 and BIST, were not included.

5121394, Jun 9, 1992

Dec 20, 1989

7/453645

Robert J. Russell - South Boston MA

Bull HN Information Systems Inc. - Billerica MA

H04B 1700

371 221

A system provides for the testing of components which connect to one or more of programmable logic devices (PLDs), each of which is organized in a predetermined manner. Each PLD includes a plurality of programmable logic sections, each of which connect to I/O pins through driver and receiver circuits. An available section includes programmed means for causing its driver circuit to force the I/O pin to a first logic level when made operational. The other sections each include programmed means for connecting their associated driver circuits to be controlled by signals applied to the receiver circuit of the available section. During testing, means are externally applied to the I/O pin of the available section which drive the pin from the first logic level to a second logic level. This causes the receiver circuit to apply signals which inhibit the driver circuits of the remaining sections from applying signals to their I/O pins thereby enabling the testing of components which connect to these I/O pins without interference.

4808915, Feb 28, 1989

Sep 2, 1986

6/903342

Robert J. Russell - Boston MA

Honeywell Bull, Inc. - Billerica MA

G01R 1512, G01R 3128

324 73R

An electronic assembly is made up of a number of electronic components. Each of the electronic components having a means for putting the component in a quiescent state while the remaining components are in a functional state, thereby enabling the testing of individual components without disassembly.