Inventors:
Aleksandar Uzelac - Seattle WA, US
David A. Stevens - Sammamish WA, US
Weidong Zhao - Redmond WA, US
Takahiro Shigemitsu - Bellevue WA, US
Briggs A. Willoughby - Newcastle WA, US
John Graham Pierce - Sammamish WA, US
Pravin Kumar Santiago - Issaquah WA, US
Craig S. Ranta - Redmond WA, US
Timothy Allen Wright - Redmond WA, US
Jeffrey C. Maier - Kirkland WA, US
Robert T. Perry - Seatac WA, US
Stanimir Naskov Kirilov - Kirkland WA, US
Andrey B. Batchvarov - Redmond WA, US
Assignee:
MICROSOFT CORPORATION - Redmond WA
International Classification:
G06F 3/044, G06F 3/041
Abstract:
Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.