ROBERT HENDERSON
Physical Therapy at Lamar Blvd, Austin, TX

License number
Texas 1258711
Category
Restorative Service Providers
Type
Physical Therapist
Address
Address
7801 N Lamar Blvd #B174, Austin, TX 78752
Phone
(512) 371-7173
(512) 259-7056 (Fax)

Personal information

See more information about ROBERT HENDERSON at radaris.com
Name
Address
Phone
Robert Henderson, age 100
5125 Cape Romain Dr, Corpus Christi, TX 78412
Robert Henderson
50 Stagecoach Ct, Lockhart, TX 78644
(512) 508-0543
Robert Henderson
5020 7Th St, Bay City, TX 77414
Robert Henderson
5011 Mauritz Dr, Houston, TX 77032
(281) 389-9322
Robert Henderson, age 84
5169 Del Valle Pl, El Paso, TX 79932
(915) 581-4051

Professional information

Robert Henderson Photo 1

Robert Henderson - Austin, TX

Work:
Health South Rehab - Austin, TX
Physical therapy Technician
Paychex Inc - Austin, TX
Payroll Consultant
Enterprise Rent-A-Car - Valencia, CA
District Manager
Education:
University of St Augustine for Health Sciences - Austin, TX
DPT in PT. Completed MTC route. (S1, S2, S3, S4, E1, E2, MF1, MF2, MSK1-4.)
Concentra Medical Center - Austin, TX
MA in Student Rotations. I've completed 3 rotations that specialize in LTAC, acute, ortho, neuro, sports. Experience with documenting via EMR and paper.
Texas Tech University, Jerry S. Rawls College of Business - Tech, Texas, US
BA in Business Analytics, Business plan with emphasis on strategic management.
Skills:
Responsible, Trustworthy, Dependable<br/>High proficiency with manual therapy techniques<br/>Can contribute to growth in your business<br/>Ability to work well in a team environment<br/>Superior work ethic, self-starter, efficient learner<br/>Adaptable, Punctual, Innovative, Dynamic


Robert Henderson Photo 2

Photomask And Method For Evaluating An Initial Calibration For A Scanning Electron Microscope

US Patent:
6861181, Mar 1, 2005
Filed:
Sep 19, 2002
Appl. No.:
10/247426
Inventors:
Robert K. Henderson - Austin TX, US
Assignee:
DuPont Photomasks, Inc. - Round Rock TX
International Classification:
G03F009/00
US Classification:
430 5, 430 30, 430296, 430942, 382144
Abstract:
A photomask and method for evaluating an initial calibration for a scanning electron microscope are disclosed. The method includes generating an initial calibration for a SEM that contains a target width for a feature on a reference target and measuring the feature on the reference target in the SEM to determine a measured width for the feature. The measured width is compared to the target width to generate a shift deviation and a current calibration for the SEM is adjusted based on the shift deviation.