ROBERT E ALLARD
Optometry in Andover, MA
License number
Massachusetts 2478
Issued Date
Aug 14, 1974
Expiration Date
Jan 31, 2009
Type
Optometrist
Address
Address
Andover, MA 01810
Professional information
Handheld Spectrometer
US Patent:
2010008, Apr 1, 2010
Filed:
Sep 25, 2009
Appl. No.:
12/567263
Inventors:
Andrew Hession-Kunz - Concord MA, US
Robert Allard - Andover MA, US
Jerzy Wilder - Natick MA, US
Robert Allard - Andover MA, US
Jerzy Wilder - Natick MA, US
Assignee:
i-Nalysis LLC - Concord MA
International Classification:
G01N 23/223
US Classification:
378 45, 378 98
Abstract:
A handheld X-ray fluorescence spectrometer includes a pyroelectric radiation source for directing X-rays toward a sample to be analyzed and a detector for receiving secondary X-rays emitted from the sample and converting the secondary X-rays into one or more electrical signals representative of the received secondary X-rays. A module is configured to receive the one or more electrical signals and send a representation of the one or more signals over a communication channel to a computing device without performing any spectral analysis on the one or more electrical signals to characterize the sample. The computing device is configured to perform spectral analysis on the one or more electrical signals and send the spectral analysis to the spectrometer over the communications channel.
Handheld Spectrometer
US Patent:
2013015, Jun 20, 2013
Filed:
Jun 20, 2012
Appl. No.:
13/528282
Inventors:
Andrew Hession-Kunz - Concord MA, US
Robert Allard - Andover MA, US
Jerzy Wilder - Natick MA, US
Robert Allard - Andover MA, US
Jerzy Wilder - Natick MA, US
Assignee:
i-Nalysis LLC - Concord MA
International Classification:
G01N 23/223
US Classification:
378 48
Abstract:
A handheld X-ray fluorescence spectrometer includes a pyroelectric radiation source for directing X-rays toward a sample to be analyzed and a detector for receiving secondary X-rays emitted from the sample and converting the secondary X-rays into one or more electrical signals representative of the received secondary X-rays. A module is configured to receive the one or more electrical signals and send a representation of the one or more signals over a communication channel to a computing device without performing any spectral analysis on the one or more electrical signals to characterize the sample. The computing device is configured to perform spectral analysis on the one or more electrical signals and send the spectral analysis to the spectrometer over the communications channel.