ROBERT COLLINS GIBBONS
Pilots at Parkview Cir, Richardson, TX

6437332, Aug 20, 2002

Apr 24, 2001

09/841772

Robert C. Gibbons - Richardson TX
Samuel R. McKenney - Dallas TX
S. Charles Baber - Richardson TX
Richard R. Chang - McKinney TX
Michael C. Bell - Garland TX

Raytheon Company - Lexington MA

B29D 1100

250340, 250330

A method uses an infrared imaging system to produce an image of a scene. Actual infrared radiation from the scene is detected to form a biased signal representing the radiances of objects wiithin the scene, and the biased signal is diffracted by causing rays of the radiation to pass through an array of lenslets at angles devitated from their normal path. The array includes an infrared transmissive deformable film which retains a pattern stamped into it, the pattern including a plurality of the diffracting lenslets. The diffracted and defocused radiation is detected to form a reference signal, the reference signal is subtracted from the biased signal to obtain an unbiased signal, and an image is generated and displayed in reponse to the unbiased signal.

5925880, Jul 20, 1999

Aug 22, 1997

8/918642

Ching-ju Jennifer Young - Dallas TX
Robert C. Gibbons - Richardson TX
A-Lan Reynolds - Bedford TX

Raytheon Company - Lexington MA

H01J 4014

2502521

Methods of calculating gain correction values and offset correction values for detector elements of an infrared detector array. The methods can be adapted for one-dimensional scanning arrays or for two-dimensional staring arrays. (FIGS. 3 and 6). The array is mechanically dithered so that two or more neighboring detector elements of the array look at the same location of a scene. (FIG. 3, Step 302; FIG. 6, Step 601). Then, the fields of pixel data are processed to calculate a gain correction value and an offset correction value for each detector element. (FIG. 3, Steps 305, 309, and 311; FIG. 6, Steps 603, 607, and 611). For each detector element, its gain error and its offset error are calculated from local averages, with the local average for a particular detector element including a term for that detector element as well as terms for its neighboring detector elements.

4431917, Feb 14, 1984

Nov 27, 1981

6/325459

Robert C. Gibbons - Richardson TX

Texas Instruments Incorporated - Dallas TX

H01J 3149, G01J 100

250332

An optical system is disclosed for use with a radiant energy receiver which provides high cold shield efficiency and is compact; further the optical system is temperature tolerant to maintain focus with changes in temperature and wavelength without operator intervention. The optical system has primary utility in the infrared region of the spectrum and where a two dimensional array of detectors senses the infrared radiant energy or flux from the scene of interest. The optical system is comprised of a window for environmental protection and two objective mirrors for folding and focusing the scene of interest on a first focal plane. Relay optical means, which may be comprised of one or more optical elements, relays and relocates the first focal plane to a second focal plane which is coincident with the surface of the two dimensional detector array; the relay optical means also forms an exit pupil (the image of the aperture stop) around which the aperture of a cold shield is positioned to minimize extraneous radiant energy falling on the detector array. Using a positive and negative refractive lens and judicious selection of materials allows the relay optical means to automatically compensate for variation in its index of refraction as a function of temperature and wavelength.

6232044, May 15, 2001

Nov 30, 1993

8/159879

Robert C. Gibbons - Richardson TX
Samuel R. McKenney - Dallas TX
S. Charles Baber - Richardson TX
Richard R. Chang - McKinney TX
Michael C. Bell - Garland TX

Raytheon Company - Lexington MA

B29D 1100, G02B 502, G02B 2604

430321

A chopper and method of making same, the chopper being fabricated by initially generating a photomask in conjunction with software. The software provides the lens design to be finally stamped onto the chopper element. A silicon wafer is then etched by reactive ion etching using the photomask to provide the pattern and resulting in a silicon wafer master of the chopper pattern with regions in the shape oflenslets to be formed of desired dimension. The chopper pattern on the silicon wafer is then replicated with a hard material which can be easily stripped from the silicon wafer without damaging either the wafer or the hard material, preferably deposited nickel. The separated nickel replication is then used in conjunction with a heavy press to stamp out sheets of an infrared transmissive flexible film, preferably polyethylene, with the lens pattern in the replication The film with the lens pattern thereon is the chopper element. The system is designed to operate in the 8 to 13. 5 micron range.

4471222, Sep 11, 1984

Jun 4, 1982

6/385145

Eugene F. Fowler - Richardson TX
Robert C. Gibbons - Richardson TX

The United States of America as represented by the Secretary of the Army - Washington DC

G01J 336, G02B 1314

250350

A bifunctional sensor is disclosed for an optical seeking system which utzes a single focussing lens arrangement for focussing light of two distinct wavelength ranges. A first detector for detecting light of the first wavelength range is provided nearest the lens system and transmits light of the second wavelength range. A second detector for detecting light of the second wavelength range is provided behind the first detector with a modulating apparatus for modulating the light of the second wavelength range before it reaches the second detector.

8044355, Oct 25, 2011

Jul 12, 2007

11/777020

Robert C. Gibbons - Richardson TX, US
Stephen H. Black - Buellton CA, US
Richard N. Mullins - Goleta CA, US

Raytheon Company - Waltham MA

G01J 5/02, G01J 5/04

250353, 2503381, 2503384, 250347

According to one embodiment of the present invention, a system for viewing an area includes a dewar and an optical system positioned within the dewar. The dewar permits operation of the flux detector at cryogenic temperatures, in some embodiments. The optical system includes an infrared radiation system capable of focusing one or more light beams. The inclusion of the optical system within the cryogenic space of the dewar allows reduction of the overall system length and weight, if desired.

8294103, Oct 23, 2012

Oct 24, 2011

13/280061

Robert C. Gibbons - Richardson TX, US
Stephen H. Black - Buellton CA, US
Richard N. Mullins - Goleta CA, US

Raytheon Company - Waltham MA

G01J 5/04

25033903

According to one embodiment of the present invention, a system for viewing an area includes a dewar and an optical system positioned within the dewar. The dewar permits operation of the flux detector at cryogenic temperatures, in some embodiments. The optical system includes an infrared radiation system capable of focusing one or more light beams. The inclusion of the optical system within the cryogenic space of the dewar allows reduction of the overall system length and weight, if desired.

4877317, Oct 31, 1989

Feb 27, 1987

7/002061

Robert C. Gibbons - Richardson TX
Wilbur W. Cottle - Plano TX

Texas Instruments Incorporated - Dallas TX

G02B 1502, G02B 2304

350559

A dual field of view catadioptric optical system is disclosed which includes a narrow field of view (FOV) and a wide FOV. The narrow field of view includes an apertured stationary primary reflector and a secondary reflector which may be pivoted into a common optical path for blocking radiant energy for the wide field of view during operation in the narrow field of view and pivoted out of the common optical path for operation in the wide field of view. In another embodiment, the secondary reflector is replaced by a transparent/reflector which is always located in the common optical path. The element is transparent to radiant energy until heated at which time it becomes reflective. Thus, when transparent, the system operates in the wide field of view mode and when reflective, the system operates in the narrow field of view mode.

8314814, Nov 20, 2012

Dec 18, 2008

12/338624

Robert C. Gibbons - Richardson TX, US

Raytheon Company - Waltham MA

G09G 5/00, G09G 5/391

345619, 345 8, 345 9, 345 33, 345428, 345581, 345627, 345628, 385116, 385120

According to one embodiment, an imaging system includes a processing system and a display generator. The processing system is operable to process a signal received from a camera to yield foveal data for a foveal display region and outer data for an outer display region. The outer data have a reduced pixel density with respect to the pixel density of the foveal data. The display generator is operable to generate the foveal display region from the foveal data according to a 1:n mapping ratio, and generate the outer display region from the outer data according to a 1:m mapping ratio, where m is greater than n.