ROBERT ALAN DURIS
Pilots at Lombard Rd, Hubbardston, MA

7199604, Apr 3, 2007

Mar 26, 2004

10/811189

Bruce A. Hecht - Brookline MA, US
Robert Duris - Hubbardston MA, US
Warren Hambly - West Bridgewater MA, US

Analog Devices, Inc. - Norwood MA

H03K 17/16, H03B 1/00

326 30, 327108, 327321

Driver circuits and methods for operating driver circuits in automatic test equipment are provided. The driver circuit includes an output circuit operable in a dynamic mode and in a termination mode, and a mode control circuit for supplying a first current to the output circuit in the dynamic mode and for supplying a second current to the output circuit in the termination mode in response to a mode select signal. The mode control circuit may include a current multiplier and a switching circuit for switching a control current supplied to the current multiplier. In one example, the slew current supplied to the output circuit is controlled in response to the mode select signal.

7248035, Jul 24, 2007

Nov 25, 2003

10/722970

Douglas W. Babcock - Manchester NH, US
Robert A. Duris - Hubbardston MA, US
Bruce Hecht - Brookline MA, US

Analog Devices, Inc. - Norwood MA

G01R 27/26

3241581, 324 731

A passive matching network is connected to an input/output line for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit connected to the line, and also an optional current-mode driver circuit. The matching circuit preferably comprises a T-coil circuit that can include a bridging capacitor; separate T-coil circuits can be provided to separately compensate for receiver circuit and current-mode driver circuit capacitances. The driver and receiver circuits can be implemented on a common layer of an integrated circuit, with the T-coil windings implemented in a separate layer of the same integrated circuit that is spaced from the common layer by at least one dielectric layer.

6507231, Jan 14, 2003

Aug 24, 2001

09/939201

Bruce Hecht - Brookline MA
Stephan Goldstein - Reading MA
Robert Duris - Hubbardston MA

Analog Devices, Inc. - Norwood MA

H03K 508

327321

A clamp for use with a circuit (having an output for delivering an output voltage) forms a voltage boundary for the output voltage based upon a clamp voltage. To that end, the clamp includes a clamp input for receiving the clamp voltage, a clamp transistor in communication with the clamp input, and a control transistor in communication with the output. The clamp also includes a driving source for driving at least one of the clamp and control transistors based upon the voltage at the clamp input and the voltage at the output. The output is clamped at a voltage within the voltage boundary of the clamp voltage after the clamp transistor begins being driven by the driving source.

5424510, Jun 13, 1995

Aug 27, 1993

8/113397

Alex Gusinov - Brighton MA
A. Paul Brokaw - Burlington MA
Douglas W. Babcock - Manchester NH
Lewis Counts - Lexington MA
Lawrence DeVito - Tewksbury MA
Robert A. Duris - Hubbardston MA
Scott Wurcer - Cambridge MA

Analog Devices Inc. - Norwood MA

H05B 302

219209

A circuit for varying the temperature of a first bipolar transistor in order to thermally compensate for self-heating effects of an associated device in a common signal path with the first transistor, the first transistor being configured within an isolated collector region. The circuit includes a second bipolar transistor provided within the isolated collector region and thermally coupled to the first transistor, the second transistor operable for providing heat to the first transistor to alter the temperature to a predetermined level, thus changing the operational voltage characteristics of the first transistor so as to minimize shifts in offset voltage.

5434446, Jul 18, 1995

Aug 8, 1994

8/287478

Edward B. Hilton - Wayland MA
Robert A. Duris - Hubbardston MA
Douglas W. Babcock - Manchester NH

Analog Devices, Inc. - Norwood MA

H01L 2712, H01L 2702

257503

A parasitic capacitance cancellation circuit for a direct bonded silicon-on-insulator integrated circuit includes one or more transistors fabricated silicon-on-insulator; a silicon substrate region outside the transistor(s) having a parasitic capacitance to be cancelled; a bootstrap terminal connected to the region outside the transistor(s); and a unity gain buffer responsive to the output of the transistor(s) and having its output connected to the bootstrap terminals for providing a voltage to the region outside the transistor(s) which follows the voltage developed on the parasitic capacitance and nullifies the parasitic capacitance.

7470968, Dec 30, 2008

Jan 4, 2006

11/325882

Douglas W. Babcock - Manchester NH, US
Robert A. Duris - Hubbardston MA, US
Bruce Hecht - Brookline MA, US

Analog Devices, Inc. - Norwood MA

H01L 27/08

257531, 257E21575, 257566, 257578, 257728, 3241581, 324763, 324765

A passive matching network is connected to an input/output line for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit connected to the line, and also an optional current-mode driver circuit. The matching circuit preferably comprises a T-coil circuit that can include a bridging capacitor; separate T-coil circuits can be provided to separately compensate for receiver circuit and current-mode driver circuit capacitances. The driver and receiver circuits can be implemented on a common layer of an integrated circuit, with the T-coil windings implemented in a separate layer of the same integrated circuit that is spaced from the common layer by at least one dielectric layer.