RICHARD S DAVIS
Broker in Beverly Farms, MA
License number
Massachusetts 24205
Issued Date
Feb 1, 1975
Expiration Date
Nov 10, 1978
Type
Salesperson
Address
Address
Beverly Farms, MA 01915
Professional information
Relayless Voltage Measurement In Automatic Test Equipment
US Patent:
6194910, Feb 27, 2001
Filed:
Jun 24, 1998
Appl. No.:
9/104099
Inventors:
Richard P. Davis - Beverly MA
Assignee:
Teradyne, Inc. - Boston MA
International Classification:
G01R 3102
US Classification:
324765
Abstract:
A tester that is capable of performing voltage measurements on electronic circuits is disclosed. The tester includes voltage measurement circuitry with an input, a plurality of gain stages, and switching circuitry coupled between the input and the gain stages. The switching circuitry includes a plurality of diodes, and a portion of the gain stages includes current-to-voltage converters. Each diode is coupled to a respective current-to-voltage converter. By applying different bias voltages to the respective current-to-voltage converters, the diodes can be made to conduct current for different ranges of voltages at the input. The output of each current-to-voltage converter is proportional to a respective voltage range.
Integrated Multi-Channel Analog Test Instrument Architecture Providing Flexible Triggering
US Patent:
6363507, Mar 26, 2002
Filed:
Oct 19, 1998
Appl. No.:
09/174866
Inventors:
Eric L. Truebenbach - Sudbury MA
Richard P. Davis - Beverly MA
John J. Arena - Reading MA
Teresa P. Lopes - Somerville MA
David J. Lind - Stoughton MA
Richard P. Davis - Beverly MA
John J. Arena - Reading MA
Teresa P. Lopes - Somerville MA
David J. Lind - Stoughton MA
Assignee:
Teradyne, Inc. - Boston MA
International Classification:
G01R 3128
US Classification:
714734
Abstract:
Analog test instrument architecture for performing functional testing of electronic circuit assemblies is disclosed. The analog test instrument includes a plurality of identical channels, each channel including circuitry for driving test stimuli and measuring responses at one node of a circuit assembly under test. The driver and measurement circuitry in each channel implement functions that traditionally have been implemented in a test system using discrete instruments. The analog test instrument further includes a master clock reference, which is used for synchronizing the operation of the driver and measurement circuits. Each channel further includes triggering circuitry for distributing trigger events within the channel and to the other channels; and, an input buffer, which is shared by the measurement circuits in the channel. The synchronized operation, distributed trigger events, and shared input buffers are used to improve the correlation of measurements made during functional testing.