Inventors:
Richard Roelke - Bedford NH
Assignee:
Metronics, Inc. - Bedford NH
International Classification:
G01N 2100
Abstract:
A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.