DR. RALPH STEVEN GRECO, M.D.
Radiology at Pasteur Dr, Palo Alto, CA
License number
California G85803
Category
Radiology
Type
Surgical Oncology
Address
Address
300 Pasteur Dr, Palo Alto, CA 94305
Phone
(650) 736-1250
(650) 724-9806 (Fax)
(650) 724-9806 (Fax)
Professional information
Multi-Layer Structure Having A Predetermined Layer Pattern Including An Agent
US Patent:
2006026, Nov 30, 2006
Filed:
Apr 11, 2006
Appl. No.:
11/402651
Inventors:
WonHyoung Ryu - Stanford CA, US
Rainer Fasching - Mill Valley CA, US
Friedrich Prinz - Woodside CA, US
Ralph Greco - Stanford CA, US
Rainer Fasching - Mill Valley CA, US
Friedrich Prinz - Woodside CA, US
Ralph Greco - Stanford CA, US
International Classification:
A61K 51/00, A61K 9/14
US Classification:
424001110, 424486000
Abstract:
Improved controlled therapy is provided with a polymer multi-layer structure having a predetermined micro-fabricated spatial pattern (e.g., reservoirs and channels). More specifically, all geometrical details of the spatial pattern are substantially predetermined. The increased control of pattern geometry provided by the invention allows for improved control of therapy. In preferred embodiments, the polymer multi-layer structure of the invention is biodegradable, but has an in vivo lifetime that is greater than the duration of the therapy being provided. Thus, the geometrical pattern of the polymer structure that controls delivery of the therapy persists without significant change during therapy, and the structure degrades after completion of therapy. In this manner, possible interference of degradation by-products with therapy is minimized, and delivery of therapy does not depend on details of how degradation proceeds.
Ralph Steven Greco, Stanford CA
Specialties:
Surgeon
Address:
300 Pasteur Dr, Stanford, CA 94305
Education:
Yale University, School of Medicine - Doctor of Medicine
Yale-New Haven Hospital - Residency - Surgery
Yale-New Haven Hospital - Residency - Surgery
Board certifications:
American Board of Surgery Certification in Surgery
Device And Method Or Three-Dimensional Spatial Localization And Functional Interconnection Of Different Types Of Cells
US Patent:
2002017, Nov 21, 2002
Filed:
May 17, 2002
Appl. No.:
10/150399
Inventors:
Kyle Hammerick - Palo Alto CA, US
Friedrich Prinz - Woodside CA, US
Robert Smith - Palo Alto CA, US
Ralph Greco - Stanford CA, US
Rainer Fasching - Tiburon CA, US
Friedrich Prinz - Woodside CA, US
Robert Smith - Palo Alto CA, US
Ralph Greco - Stanford CA, US
Rainer Fasching - Tiburon CA, US
International Classification:
C12M003/00
US Classification:
435/305200, 435/288500, 435/029000
Abstract:
A device, method and process for three-dimensional spatial localization and functional interconnection of the same or different types of cells. The two or three-dimensional device comprising multiple layers containing wells for cell deposition where both the wells and layers are interconnected through microfluidic channels. A process for fabricating the three-dimensional device and a method for depositing different types of cells within the device in a functional interdependent spatial orientation thereby mimicking physiological functions. The device is useful for diagnostic assays, determination of dysfunction of certain cells in the system, quantification of production of cellular proteins, metabolites, hormones or other cellular products, for organ or tissue replacement, for co-culturing different cells, for testing pharmaceutical agents and as a bioreactor for production of biologicals.
3-D Interconnected Multi-Layer Microstructure Of Thermoplastic Materials
US Patent:
7557051, Jul 7, 2009
Filed:
Mar 11, 2005
Appl. No.:
11/078907
Inventors:
WonHyoung Ryu - Stanford CA, US
Seoung Jai Bai - Stanford CA, US
Kyle Hammerick - Palo Alto CA, US
Robert Lane Smith - Palo Alto CA, US
Ralph S. Greco - Stanford CA, US
Friedrich B. Prinz - Woodside CA, US
Rainer J. Fasching - Mill Valley CA, US
Seoung Jai Bai - Stanford CA, US
Kyle Hammerick - Palo Alto CA, US
Robert Lane Smith - Palo Alto CA, US
Ralph S. Greco - Stanford CA, US
Friedrich B. Prinz - Woodside CA, US
Rainer J. Fasching - Mill Valley CA, US
Assignee:
The Board of Trustees of the Leland Stanford Junior University - Palo Alto CA
International Classification:
H01L 21/00, B29C 45/00
US Classification:
438800, 26432816
Abstract:
Methods for compression molding through holes in polymer layers are provided, as are the resulting patterned polymer layers. Two key aspects of the invention are provision of a mold and substrate having different mechanical hardness, and provision of room for local flow of material. These aspects of the invention facilitate formation of through holes by compression molding that are not blocked or partially blocked by undesirable material. These polymer layers can be formed into three dimensional patterned structures by bonding patterned layers together. Since the layers include through holes, a three-dimensional polymer pattern can be formed. These patterned polymer layers and three dimensionally patterned polymer constructs have a wide variety of applications. For example, these constructs can be used for fabrication of micro-fluidic devices, and/or can be used for various medical and biological applications including drug delivery devices and tissue engineering devices.
Sensors For Electrochemical, Electrical Or Topographical Analysis
US Patent:
7444856, Nov 4, 2008
Filed:
Sep 22, 2005
Appl. No.:
11/233677
Inventors:
Friedrich B. Prinz - Woodside CA, US
Ye Tao - Stanford CA, US
Rainer J. Fasching - Mill Valley CA, US
Ralph S. Greco - Stanford CA, US
Kyle Hammerick - Mountain View CA, US
Robert Lane Smith - Palo Alto CA, US
Ye Tao - Stanford CA, US
Rainer J. Fasching - Mill Valley CA, US
Ralph S. Greco - Stanford CA, US
Kyle Hammerick - Mountain View CA, US
Robert Lane Smith - Palo Alto CA, US
Assignee:
The Board of Trustees of the Leland Stanford Junior University - Palo Alto CA
International Classification:
G12B 21/02, G12B 21/06, G01N 13/10, G01N 13/24, B82B 1/00
US Classification:
73105, 324715, 422 8201, 436 63, 977860, 977869, 977875
Abstract:
Sensors and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided. The sensors include a cantilever and one or more probes, each of which has an electrode at its tip. The tips of the probes are sharp, with a radius of curvature of less than about 50 nm. In addition, the probes have a high aspect ratio of more than about 19:1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.