PHILIP EDWARD BATSON
Pilots at Bedford Rd, Katonah, NY

License number
New York A0106127
Issued Date
Jan 2016
Expiration Date
Jan 2018
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
8 Bedford Rd, Katonah, NY 10536

Professional information

Philip Batson Photo 1

Limiting Magnetoresistive Electrical Interaction To A Preferred Portion Of A Magnetic Region In Magnetic Devices

US Patent:
6590750, Jul 8, 2003
Filed:
Feb 10, 1998
Appl. No.:
09/021352
Inventors:
David William Abraham - Ossining NY
Philip Edward Batson - Katonah NY
John Slonczewski - Katonah NY
Philip Louis Trouilloud - Mahwah NJ
William Joseph Gallagher - Ardsley NY
Stuart Parkin - San Jose CA
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11B 539
US Classification:
3603242, 3603241
Abstract:
Magnetoresistive devices are disclosed which include a changeable magnetic region within which at least two magnetic states can be imposed. Upon magnetoresistive electrical interaction with the device, the relative orientation of the magnetic states of the changeable magnetic region, and a proximate reference magnetic region, can be sensed thereby providing a binary data storage capability. The present invention limits the electrical interaction to only a preferred portion of the changeable magnetic region, e. g. , the portion within which the two magnetic states can be dependably predicted to be substantially uniform, and opposite of one another. Structures for limiting the electrical interaction to this preferred portion of the changeable magnetic region are disclosed, and include smaller interaction regions, and alternating areas of insulation and conductive, interaction regions, disposed proximate the changeable magnetic region. The principles of the present invention can be applied to magnetic random access memory (“MRAM”) arrays, which employ giant magnetoresistive (“GMR”) cells, or magnetic tunnel junction (“MTJ”) cells, at the intersections of bitlines and wordlines, and also to magnetic sensors such as magnetic data storage devices having access elements used to access data on a magnetic data storage medium.


Philip Batson Photo 2

Limiting Magnetoresistive Electrical Interaction To A Preferred Portion Of A Magnetic Region In Magnetic Devices

US Patent:
6452764, Sep 17, 2002
Filed:
Oct 16, 2000
Appl. No.:
09/688732
Inventors:
David William Abraham - Ossining NY
Philip Edward Batson - Katonah NY
William Joseph Gallagher - Ardsley NY
Stuart Parkin - San Jose CA
John Slonczewski - Katonah NY
Philip Louis Trouilloud - Mahwah NJ
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11B 539
US Classification:
3603242, 365173
Abstract:
Magnetoresistive devices are disclosed which include a changeable magnetic region within which at least two magnetic states can be imposed. Upon magnetoresistive electrical interaction with the device, the relative orientation of the magnetic states of the changeable magnetic region, and a proximate reference magnetic region, can be sensed thereby providing a binary data storage capability. The present invention limits the electrical interaction to only a preferred portion of the changeable magnetic region, e. g. , the portion within which the two magnetic states can be dependably predicted to be substantially uniform, and opposite of one another. Structures for limiting the electrical interaction to this preferred portion of the changeable magnetic region are disclosed, and include smaller interaction regions, and alternating areas of insulation and conductive, interaction regions, disposed proximate the changeable magnetic region. The principles of the present invention can be applied to magnetic random access memory (“MRAM”) arrays, which employ giant magnetoresistive (“GMR”) cells, or magnetic tunnel junction (“MTJ”) cells, at the intersections of bitlines and wordlines, and also to magnetic sensors such as magnetic data storage devices having access elements used to access data on a magnetic data storage medium.


Philip Batson Photo 3

Method For Forming Crystalline Silicon Nitride

US Patent:
6707086, Mar 16, 2004
Filed:
Jun 15, 2000
Appl. No.:
09/594638
Inventors:
Rajarao Jammy - Wappingers Falls NY
Philip L. Flaitz - Newburgh NY
Philip E. Batson - Katonah NY
Hua Shen - Beacon NY
Yun Yu Wang - Poughquah NY
Assignee:
Infineon Technologies AG - Munich
International Business Machines Corp. - Armonk NY
International Classification:
H01L 31119
US Classification:
257296, 257301, 257309
Abstract:
In accordance with the present invention, a method for forming a crystalline silicon nitride layer, includes the steps of providing a crystalline silicon substrate with an exposed surface, precleaning the exposed surface by employing a hydrogen prebake and exposing the exposed surface to nitrogen to form a crystalline silicon nitride layer. Also, a trench capacitor, in accordance with the present invention, includes a crystalline silicon substrate including deep trenches having surface substantially free of native oxide. A dielectric stack, including a crystalline silicon nitride layer, is formed on the sidewalls of the trenches. The dielectric stack forms a node dielectric between electrodes of the trench capacitor.


Philip Batson Photo 4

Method For Forming Crystalline Silicon Nitride

US Patent:
2002013, Sep 26, 2002
Filed:
Jul 29, 1999
Appl. No.:
09/363523
Inventors:
RAJARAO JAMMY - WAPPINGERS FALLS NY, US
PHILIP L. FLAITZ - NEWBURGH NY, US
PHILIP E. BATSON - KATONAH NY, US
HUA SHEN - BEACON NY, US
YUN YU WANG - POUGHQUAG NY, US
International Classification:
H01L021/31, H01L021/469
US Classification:
438/791000, 438/762000, 438/775000
Abstract:
In accordance with the present invention, a method for forming a crystalline silicon nitride layer, includes the steps of providing a crystalline silicon substrate with an exposed surface, precleaning the exposed surface by employing a hydrogen prebake and exposing the exposed surface to nitrogen to form a crystalline silicon nitride layer. Also, a trench capacitor, in accordance with the present invention, includes a crystalline silicon substrate including deep trenches having surface substantially free of native oxide. A dielectric stack, including a crystalline silicon nitride layer, is formed on the sidewalls of the trenches. The dielectric stack forms a node dielectric between electrodes of the trench capacitor.