PETER RICHARD BURKE
Medical Practice in Georgia, VT

License number
Pennsylvania MD040133L
Category
Medicine
Type
Medical Physician and Surgeon
Address
Address 2
Georgia, VT 05468
Pennsylvania

Personal information

See more information about PETER RICHARD BURKE at radaris.com
Name
Address
Phone
Peter Von Burke
3425 Decatur St, Philadelphia, PA 19136
Peter Von Burke
345 Mauch Chunk St APT 5, Nazareth, PA 18064
Peter Von Burke
401 E Chester Pike APT D, Ridley Park, PA 19078
Peter Von Burke
407 Doe Run Ln, Springfield, PA 19064
Peter Von Burke
906A W Main St, New Holland, PA 17557

Professional information

See more information about PETER RICHARD BURKE at trustoria.com
Peter Burke Photo 1
Peter Burke, Saint Albans VT

Peter Burke, Saint Albans VT

Work:
Northwestern Medical Center
133 Fairfield St, Saint Albans, VT 05478


Peter Richard Burke Photo 2
Peter Richard Burke, Saint Albans VT

Peter Richard Burke, Saint Albans VT

Specialties:
Pathologist
Address:
133 Fairfield St, Saint Albans, VT 05478
Education:
Dartmouth College, Medical School - Doctor of Medicine
Dartmouth-Hitchcock Medical Center - Residency - Pathology
Children's Hospital - Residency - Pathology
Board certifications:
American Board of Pathology Certification in Clinical Pathology (Pathology)


Peter R Burke Photo 3
Dr. Peter R Burke, Saint Albans VT - MD (Doctor of Medicine)

Dr. Peter R Burke, Saint Albans VT - MD (Doctor of Medicine)

Specialties:
Anatomic & Clinical Pathology
Address:
NORTHWESTERN MEDICAL CENTER RADIOLOGY DEPARTMENT
133 Fairfield St, Saint Albans 05478
(802) 524-5911 (Phone), (802) 524-1238 (Fax)
Certifications:
Anatomic & Clinical Pathology, 1992
Awards:
Healthgrades Honor Roll
Languages:
English
Hospitals:
NORTHWESTERN MEDICAL CENTER RADIOLOGY DEPARTMENT
133 Fairfield St, Saint Albans 05478
Northwestern Medical Center
133 Fairfield St, Saint Albans 05478
Education:
Medical School
Dartmouth College
Graduated: 1984
Dartmouth-Hitchcock Mc
Ms Hershey Mc-Penn State U


Peter Burke Photo 4
Process For Improving Sheet Resistance Of An Integrated Circuit Device Gate

Process For Improving Sheet Resistance Of An Integrated Circuit Device Gate

US Patent:
5268330, Dec 7, 1993
Filed:
Dec 11, 1992
Appl. No.:
7/989604
Inventors:
John H. Givens - Essex VT
James S. Nakos - Essex VT
Peter A. Burke - Milton VT
Craig M. Hill - Essex Junction VT
Chung H. Lam - Williston VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21283, H01L 21302
US Classification:
437195
Abstract:
A passivating layer is deposited over an integrated circuit device, conventionally fabricated using silicidation, after which an insulating layer is deposited. The insulating layer is planarized and further polished to expose the passivating layer above the gate. The portion of the passivating layer above the gate is removed with little or no effect on the insulating layer or gate. A trench above one or both junctions (source or drain) is formed by removing insulation using the passivating layer as an etch stop, then removing a portion of the passivating layer above the junction with little or no effect on the junction or any isolation region present. The gate may be further silicided, and the opening above the gate and the trench above the junction may each be planarly filled with a low sheet resistance conductive material, forming contacts. The contact above the junction may be borderless.


Peter Burke Photo 5
Polishstop Planarization Structure

Polishstop Planarization Structure

US Patent:
5510652, Apr 23, 1996
Filed:
Oct 6, 1994
Appl. No.:
8/319388
Inventors:
Peter A. Burke - Milton VT
Michael A. Leach - Milpitas CA
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21304, H01L 23485
US Classification:
257752
Abstract:
The invention provides a method for producing a substantially planar surface overlying features of a semiconductor structure. The method comprises forming alternating layers of a hard polishing material and a soft polishing material over the features of the semiconductor structure, and then polishing the alternating layers to form a substantially planar surface over the features. The method takes advantage of the polish rates of the various materials used as alternating layers to enhance the planarization process.


Peter Burke Photo 6
Polishstop Planarization Method And Structure

Polishstop Planarization Method And Structure

US Patent:
5356513, Oct 18, 1994
Filed:
Apr 22, 1993
Appl. No.:
8/051915
Inventors:
Peter A. Burke - Milton VT
Michael A. Leach - Milpitas CA
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 2144, H01L 21465
US Classification:
156636
Abstract:
The invention provides a method for producing a substantially planar surface overlying features of a semiconductor structure. The method comprises forming alternating layers of a hard polishing material and a soft polishing material over the features of the semiconductor structure, and then polishing the alternating layers to form a substantially planar surface over the features. The method takes advantage of the polish rates of the various materials used as alternating layers to enhance the planarization process.