PETER HAINES DERR
Engineering in East Windsor, NJ
License number
Pennsylvania 003867
Category
Engineers
Type
Engineer Temp Authority to Practice
Address
Address
2
East Windsor, NJ 08520
Pennsylvania
Pennsylvania
Personal information
See more information about PETER HAINES DERR at radaris.comName
Address
Phone
16 Inverness Ln, East Windsor, NJ 08520
16 Inverness Ln, Hightstown, NJ 08520
922 Rita Dr, Pittsburgh, PA 15221
Professional information
System And Method For Vision Examination Utilizing Fault Detection
US Patent:
2003003, Feb 13, 2003
Filed:
Aug 7, 2001
Appl. No.:
09/924265
Inventors:
George Hu - Raritan NJ, US
Vance Zemon - West Nyack NY, US
Peter Derr - East Windsor NJ, US
Vance Zemon - West Nyack NY, US
Peter Derr - East Windsor NJ, US
Assignee:
DIOPSYS, INC.
International Classification:
A61B013/00
US Classification:
600/558000
Abstract:
A system and method for performing a vision examination includes displaying a series of visual stimuli for observation by a patient and detecting the patient's visual evoked potentials in response to the visual stimuli. Electrical signals representative of the visual evoked potentials for each stimulus of each series of visual stimuli displayed is amplified, converted to digitized data, recorded and measured. The measured visual evoked potential data is then evaluated and compared to certain predetermined values in order to detect whether or not the measured data is reliable. Data outside of predetermined ranges of values is considered faulty data. For example, the measured data is compared to a maximum value of the output of an amplifier used to enhance the electrical signals, to a predetermined value of the Fourier component at 60 Hz; and to certain ranges to determine if the measured data are outside of expected limits. The occurrence of such data outside these ranges is faulty data. Upon detecting faulty data, new data can be generated until fault free data is obtained or the examination is terminated.
System And Method For Vision Examination Utilizing Fault Detection
US Patent:
2006028, Dec 14, 2006
Filed:
Aug 21, 2006
Appl. No.:
11/506931
Inventors:
George Hu - Raritan NJ, US
Vance Zemon - West Nyack NY, US
Peter Derr - East Windsor NJ, US
Vance Zemon - West Nyack NY, US
Peter Derr - East Windsor NJ, US
Assignee:
DIOPSYS, INC. - Metuchen NJ
International Classification:
A61B 13/00, A61B 5/04
US Classification:
600558000, 600544000, 600545000
Abstract:
A system and method for performing a vision examination includes displaying a series of visual stimuli for observation by a patient and detecting the patient's visual evoked potentials in response to the visual stimuli. Electrical signals representative of the visual evoked potentials for each stimulus of each series of visual stimuli displayed is amplified, converted to digitized data, recorded and measured. The measured visual evoked potential data is then evaluated and compared to certain predetermined values in order to detect whether or not the measured data is reliable. Data outside of predetermined ranges of values is considered faulty data. For example, the measured data is compared to a maximum value of the output of an amplifier used to enhance the electrical signals, to a predetermined value of the Fourier component at 60 Hz; and to certain ranges to determine if the measured data are outside of expected limits. The occurrence of such data outside these ranges is faulty data. Upon detecting faulty data, new data can be generated until fault free data is obtained or the examination is terminated.
Simultaneously Multi-Temporal Visual Test And Method And Apparatus Therefor
US Patent:
8083354, Dec 27, 2011
Filed:
Oct 3, 2007
Appl. No.:
11/905698
Inventors:
Peter H. Derr - East Windsor NJ, US
Assignee:
Diopsys, Inc. - Pine Brook NJ
International Classification:
A61B 3/02, A61B 3/00
US Classification:
351246, 351239
Abstract:
A method for determining a likelihood of a visual deficit in a subject uses a simultaneously multi-temporal visual test. At least two visual patterns are simultaneously displayed to the subject. Each pattern reverses in contrast or color at a different display frequency, and each pattern is displayed to a different region of the subject's visual field. Electrical activity of the brain of the subject is captured and sampled, and one or more frequency components are resolved from the resulting signal, where each frequency component corresponds to a different display frequency. The method then involves determining from the frequency components, optionally by comparison between the eyes, a measurement of a likelihood that a visual deficit exists in a particular area.
Method And System For Analyzing Optical Coherence Tomography (Oct) Results Using Color Reflectivity Discretization Analysis
US Patent:
2012002, Jan 26, 2012
Filed:
Jul 21, 2011
Appl. No.:
13/188193
Inventors:
Peter Derr - East Windsor NJ, US
Alberto Gonzalez - Pine Brook NJ, US
Laurie Cox - Rockaway NJ, US
Alberto Gonzalez - Pine Brook NJ, US
Laurie Cox - Rockaway NJ, US
International Classification:
G06K 9/00
US Classification:
382131
Abstract:
A method of analyzing an OCT image. An OCT image has many differently colored dots. The system detects the number of differently colored dots, quantifies them and performs statistical analyses to determine a likelihood of disease. The different colored dots correspond to different retina cell types and structures.
Apparatus And Method For Screening For Glaucoma Using Visually Evoked Potentials
US Patent:
8100533, Jan 24, 2012
Filed:
May 5, 2009
Appl. No.:
12/435678
Inventors:
Peter H. Derr - East Windsor NJ, US
Matt Emmer - Roslyn NY, US
Matt Emmer - Roslyn NY, US
Assignee:
Diopsys, Inc. - Pine Brook NJ
International Classification:
A61B 3/02, A61B 3/00
US Classification:
351239, 351200, 351222, 351246
Abstract:
A pattern VEP system for screening for glaucoma and other optic nerve related diseases/deficiencies. The system combines high contrast and low contrast testing. The low contrast testing allows for highly sensitive glaucoma testing and the high contrast allows for a sensitive test of the central vision. The system also includes a narrowly tailored method of rejecting corrupted data allowing the system to selectively salvage useful portions of a signal. The system also provides a method of data modeling to locate the N75-P100-N135 complex in a waveform and determine if it falls within the normal range.