PETER C RICHARDS, MD
Radiology at California St, San Francisco, CA
License number
California G47588
Category
Radiology
Type
Surgery
Address
Address
3838 California St SUITE 612, San Francisco, CA 94118
Phone
(415) 221-0736
(415) 221-3583 (Fax)
(415) 221-3583 (Fax)
Personal information
See more information about PETER C RICHARDS at radaris.comName
Address
Phone
36 Commonwealth Ave, San Francisco, CA 94118
3335 Trevan Rd, Pasadena, CA 91107
4414 Bayard St, San Diego, CA 92109
950 Roble Ave, Menlo Park, CA 94025
PO Box 13892, S Lake Tahoe, CA 96151
Organization information
See more information about PETER C RICHARDS at bizstanding.comPeter C Richards Inc - Peter C Richards MD
3838 California St RM 612, San Francisco, CA 94118
Categories:
Gastroenterology Physicians & Surgeons, General Surgeons, Oncology Physicians & Surgeons, ...
Phone:
(415) 221-0735 (Phone)
PETER C. RICHARDS, M.D., INC
36 Commonwealth Ave, San Francisco, CA 94118
Registration:
Sep 10, 1998
State ID:
C2119986
Business type:
Articles of Incorporation
President:
Peter Cromwell Richards (President)
Agent:
Peter C Richards Md,San Francisco, CA 94118 (Physical)
Professional information
See more information about PETER C RICHARDS at trustoria.com
Peter Cromwell Richards, San Francisco CA
Peter Cromwell Richards, San Francisco CA
Specialties:
Otolaryngology, Surgery, Medical Oncology
Work:
Peter C Richards, MD
3838 California St, San Francisco, CA 94118
3838 California St, San Francisco, CA 94118
Education:
George Washington University (1975)
Performance Analyses Of Micromirror Devices
Performance Analyses Of Micromirror Devices
US Patent:
2009019, Jul 30, 2009
Filed:
Jan 26, 2009
Appl. No.:
12/360083
Inventors:
Igor Volfman - Sunnyvale CA, US
Andrew Huibers - Sunnyvale CA, US
Satyadev Patel - Sunnyvale CA, US
Peter Richards - San Francisco CA, US
Leonid Frenkel - Palo Alto CA, US
Jim Dunphy - San Jose CA, US
Regis Grasser - Orleans, FR
Greg Schaadt - Santa Clara CA, US
Andrew Huibers - Sunnyvale CA, US
Satyadev Patel - Sunnyvale CA, US
Peter Richards - San Francisco CA, US
Leonid Frenkel - Palo Alto CA, US
Jim Dunphy - San Jose CA, US
Regis Grasser - Orleans, FR
Greg Schaadt - Santa Clara CA, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G06K 9/00, G01J 1/42
US Classification:
382141, 356218
Abstract:
The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
Color Rendering Of Illumination Light In Display Systems
Color Rendering Of Illumination Light In Display Systems
US Patent:
7131762, Nov 7, 2006
Filed:
Jul 26, 2004
Appl. No.:
10/899635
Inventors:
Peter Richards - San Francisco CA, US
Andrew Huibers - Palo Alto CA, US
Michel Combes - Santa Cruz CA, US
Andrew Huibers - Palo Alto CA, US
Michel Combes - Santa Cruz CA, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
F21V 3/04
US Classification:
362583
Abstract:
A method and apparatus for compensating for deficiency in the illumination light from a light source is provided, where the spectrum in the visible range of light from the light source is determined, and a deficiency at a wavelength or band of wavelengths in the visible range of light is determined therefrom, a color sequencing device is provided having a set of filters comprising red, green and blue filter segments, and an additional color balancing filter segment, and wherein a the color balancing segment is constructed so as to preferentially pass a band or bands of wavelengths, which band or bands are determined based on the determined deficiency of the light source.
Method Of Repairing Micromirrors In Spatial Light Modulators
Method Of Repairing Micromirrors In Spatial Light Modulators
US Patent:
7375873, May 20, 2008
Filed:
Feb 28, 2005
Appl. No.:
11/069408
Inventors:
Satyadev Patel - Sunnyvale CA, US
James Dunphy - San Jose CA, US
Peter Richards - San Francisco CA, US
Michel Combes - Santa Cruz CA, US
James Dunphy - San Jose CA, US
Peter Richards - San Francisco CA, US
Michel Combes - Santa Cruz CA, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G02B 26/00
US Classification:
359291, 359290, 359223, 359295
Abstract:
Disclosed herein is method of operating a device that comprises an array of micromirrors. The method comprises a process usable for repairing stuck micromirrors of the micromirror array during the operation. The reparation process applies, at the ON state, two consecutive refresh voltages to the mirror plates of the micromirrors in the array with the pulses being separated in time longer than the characteristic oscillation time of the micromirrors. The reparation process can be applied independently to the micromirrors. Alternatively, the reparation process can be incorporated with a bias inversion process.
Method For Making A Micromirror-Based Projection System With A Programmable Control Unit For Controlling A Spatial Light Modulator
Method For Making A Micromirror-Based Projection System With A Programmable Control Unit For Controlling A Spatial Light Modulator
US Patent:
7459333, Dec 2, 2008
Filed:
Jan 12, 2006
Appl. No.:
11/332018
Inventors:
Peter Richards - San Francisco CA, US
Andrew Huibers - Palo Alto CA, US
Satyadev Patel - Palo Alto CA, US
Andrew Huibers - Palo Alto CA, US
Satyadev Patel - Palo Alto CA, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G09G 3/34
US Classification:
438 66, 257E33072, 345 31, 345 84, 359291
Abstract:
A projection system is disclosed herein. The projection system employs a spatial light modulator comprising an array of individually addressable pixels for modulating the incident light based on image data. The modulated light is projected on a screen for viewing.
Prevention Of Charge Accumulation In Micromirror Devices Through Bias Inversion
Prevention Of Charge Accumulation In Micromirror Devices Through Bias Inversion
US Patent:
7417609, Aug 26, 2008
Filed:
Sep 25, 2007
Appl. No.:
11/860835
Inventors:
Peter R. Richards - San Francisco CA, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G09G 3/34
US Classification:
345 84, 345108, 345204, 345205
Abstract:
Methods and apparatus are provided for preventing charge accumulation in microelectromechanical systems, especially in micromirror array devices having a plurality of micromirrors. Voltages are applied to the micromirrors for actuating the micromirrors. Polarities of the voltage differences between mirror plates and electrodes are inverted so as to prevent charge accumulation.
Sequential Color Modulation Method In Display Systems
Sequential Color Modulation Method In Display Systems
US Patent:
2005019, Sep 8, 2005
Filed:
May 2, 2005
Appl. No.:
11/120457
Inventors:
Peter Richards - San Francisco CA, US
Michel Combes - Santa Cruz CA, US
Michel Combes - Santa Cruz CA, US
International Classification:
G09G003/34
US Classification:
345084000
Abstract:
Disclosed herein is method and apparatus for operating spatial light modulators using pulse-width-modulation techniques. With the method and apparatus disclosed herein the vast majority of sequential color light beams can be utilized without sacrificing the color saturation of the images to be displayed.
Image Rotation In Display Systems
Image Rotation In Display Systems
US Patent:
2006011, Jun 1, 2006
Filed:
Jan 11, 2006
Appl. No.:
11/329763
Inventors:
Dwight Griffin - San Jose CA, US
Peter Richards - San Francisco CA, US
Peter Richards - San Francisco CA, US
International Classification:
G09G 3/36
US Classification:
345098000
Abstract:
The present invention provides a method and apparatus of converting a stream of pixel data representing an image in the first orientation in space and time into a stream of bitplane data representing an image in the second orientation. The second orientation can be a horizontal, vertical, or a combination of thereof of the first orientation. The method of the invention can be performed in a “real-time” fashion, and dynamically performs predefined transformation, or alternatively performed in by a functional module implemented in a computer readable medium stored in a computing device.
Performance Analyses Of Micromirror Devices
Performance Analyses Of Micromirror Devices
US Patent:
7483126, Jan 27, 2009
Filed:
Jun 23, 2004
Appl. No.:
10/875760
Inventors:
Igor Volfman - Sunnyvale CA, US
Andrew Huibers - Palo Alto CA, US
Satyadev Patel - Sunnyvale CA, US
Peter Richards - San Francisco CA, US
Leonid Frenkel - Palo Alto CA, US
Jim Dunphy - San Jose CA, US
Regis Grasser - Mountain View CA, US
Greg Schaadt - Santa Clara CA, US
Andrew Huibers - Palo Alto CA, US
Satyadev Patel - Sunnyvale CA, US
Peter Richards - San Francisco CA, US
Leonid Frenkel - Palo Alto CA, US
Jim Dunphy - San Jose CA, US
Regis Grasser - Mountain View CA, US
Greg Schaadt - Santa Clara CA, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01N 21/88, G02B 26/00
US Classification:
356218, 356124, 356128, 359190, 359191
Abstract:
The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i. e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.