Inventors:
Mathew Lee - Oklahoma City OK, US
Paul Beard - Bigfork MT, US
Assignee:
Dechnia, LLC - Colorado Springs CO
International Classification:
G01R 22/00
Abstract:
Embedded systems that utilize RF are often times difficult to troubleshoot as the signals cannot be easily probed without special equipment. Embodied in this patent is a tool that allows the embedded systems designer to troubleshoot these said RF designs. A combined spectrum analyzer and dynamic power meter. These are two of the most important tools that a designer needs when doing RF protocol development. This, coupled with an intuitive/simple to use graphical user interface, provides the ideal tool for RF engineering doing embedded systems design, product verification, and protocol design.