Oyvind H. Nilsen
Engineers at Greenbriar Blvd, Boulder, CO
License number
Colorado 52328
Issued Date
Dec 20, 1995
Renew Date
Dec 20, 1995
Type
Engineer Intern
Address
Address
4490 Greenbriar Blvd, Boulder, CO 80303
Professional information
Polarization Based Interferometric Detector
US Patent:
8488120, Jul 16, 2013
Filed:
Apr 16, 2007
Appl. No.:
11/735900
Inventors:
John Hall - Broomfield CO, US
Oyvind Nilsen - Boulder CO, US
Oyvind Nilsen - Boulder CO, US
Assignee:
Bioptix Diagnostics, Inc. - Boulder CO
International Classification:
G01J 4/00
US Classification:
356369, 356445
Abstract:
A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.
Optical Olfactory Sensor With Holographic Readout
US Patent:
2005016, Aug 4, 2005
Filed:
Jul 2, 2003
Appl. No.:
10/517165
Inventors:
Hongke Ye - Baltimore MD, US
Oyvind Nilsen - Boulder CO, US
Dana Anderson - Boulder CO, US
Victor Bright - Boulder CO, US
Oyvind Nilsen - Boulder CO, US
Dana Anderson - Boulder CO, US
Victor Bright - Boulder CO, US
International Classification:
G01B009/021
US Classification:
356458000
Abstract:
This invention relates to optical detection of vapors, in particular devices and methods for detection of vapor concentration and changes in vapor concentration using dynamic holography. The devices and methods employ a transducer which absorbs the vapor to be tested, thereby leading to a change in the transducer. The changes in the transducer cause a change in the optical path length of an image beam which is interacted with the transducer. Dynamic holography allows determination of the change in the dimensions and index of refraction of the transducer, and thus the change in the concentration of the vapor to be tested. The devices and methods of the invention are capable of testing a plurality of vapors by using a transducer array.
Polarization Based Interferometric Detector
US Patent:
2013033, Dec 19, 2013
Filed:
Jun 27, 2013
Appl. No.:
13/929731
Inventors:
Viatcheslav Petropavlovskikh - Louisville CO, US
Oyvind Nilsen - Boulder CO, US
Oyvind Nilsen - Boulder CO, US
International Classification:
G01N 21/21
US Classification:
356369
Abstract:
A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.
Polarization Based Interferometric Detector
US Patent:
7233396, Jun 19, 2007
Filed:
Apr 17, 2006
Appl. No.:
11/379026
Inventors:
John Hall - Broomfield CO, US
Viatcheslav Petropavlovskikh - Louisville CO, US
Oyvind Nilsen - Boulder CO, US
Viatcheslav Petropavlovskikh - Louisville CO, US
Oyvind Nilsen - Boulder CO, US
Assignee:
AlphaSniffer LLC - Boulder CO
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.