Inventors:
Olgerts Stauers - Lakewood CO
Assignee:
AT&T Technologies, Inc. - New York NY
International Classification:
G01R 1512
Abstract:
A method and apparatus for testing a plurality of electrical circuit devices (100a. . . 100n FIG. 4) to determine individual device failures wherein the input, (110-117) output (118-121) and power leads (130) of each device are interconnected with corresponding input, output and power leads of the other devices to form common input, output and power leads. The ground lead (140. . . 140n) from each device is individually connected with test apparatus (102). Test signals are introduced onto the common input (110-117), output (118-121) and ground leads (130) and signals, responsive to the test signals, are monitored on the individual ground leads (140. . . 140n) by test apparatus 102 to determine individual device failure.