Inventors:
Robert Malone - Westford MA
Brian Johnson - Upton MA
Brian Beucler - Sandown NH
Robert O'Reilly - Natick MA
Normand Boucher - Lowell MA
Sarkis Ourfalian - Watertown MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G01P 2100
Abstract:
An automatic and integrated mechanical and electrical accelerometer test system including a test fixture for holding the accelerometers to be mechanically and electrically tested; a handler subsystem for automatically feeding the accelerometers to the test fixture; a shaker subsystem for mechanically testing the accelerometers, the shaker subsystem linked to the test fixture, the shaker subsystem automatically vibrating the test fixture; and a tester for electrically testing the accelerometers while the accelerometers are vibrating.