Inventors:
Jeffrey R. Sachs - Basking Ridge NJ, US
Matthew C. Wiener - Westfield NJ, US
Nathan A. Yates - Piscataway NJ, US
Assignee:
Merck & Co., Inc. - Rahway NJ
International Classification:
H01J049/00, G06F019/00
Abstract:
The present invention features mass spectrometry data analysis techniques that can be employed to selectively identify analytes differing in abundance between different sample sets. The employed techniques determine the statistical significance of changes to signals associated with mass-to-charge ratios (“m/z-intensity pairs”) between individual samples and sample sets. Based on the statistical significance, changes likely to indicate analyte level differences are identified. Based on intensities of the signals, ratios of analyte abundances can be determined.