Inventors:
Kevin Moermond - Cincinnati OH, US
Andy Joseph Galish - West Chester OH, US
John Robert Brehm - Middletown OH, US
Francis Howard Little - Cincinnati OH, US
Dean Fredrich Graber - Hamilton OH, US
Michael Timothy La Tulippe - Fairfield OH, US
Ronald Cecil McFarland - Cincinnati OH, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01B 15/06
Abstract:
A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.